Papers by Keyword: Kelvin Probe Force Microscope

Abstract: Kelvin Probe Force Microscopy is an attractive technique for characterizing the surface potential of various samples. The main advantage of this technique is its high spatial resolution together with high sensitivity. However as in any nanoscale measurements also in case of KFM it is extremly difficult to describe the uncertainty of the measurement. Moreover, a wide variety of measuring conditions, together with the complicated operation principle cause situation, where no standard calibration methods are available. In the paper we propose the model of the KFM microscope and analyze the uncertainty of the KFM measurement.

Abstract: Surface science studies of photochemistry on titanium dioxide (TiO2) were reviewed. In the studies, photochemical processes were investigated in relation to atomic-scale surface structures by applying surface-sensitive analytical methods to single crystal TiO2 surfaces with well-defined structures. It is demonstrated that a surface science approach is promising for full description of the photochemical processes on TiO2.