HOME
CONTACT
My eBook
Username:
Password:
FULLTEXT SEARCH
NEW:
Advanced Search
MSF
>
Materials Science Forum
KEM
>
Key Engineering Materials
SSP
>
Solid State Phenomena
DDF
>
Defect and Diffusion Forum
AMM
>
Applied Mechanics and Materials
AMR
>
Advanced Materials Research
AST
>
Advances in Science and Technology
JNanoR
>
Journal of Nano Research
JBBTE
>
Journal of Biomimetics, Biomaterials, and Tissue Engineering
JMNM
>
Journal of Metastable and Nanocrystalline Materials
JERA
>
International Journal of Engineering Research in Africa
AEF
>
Advanced Engineering Forum
NH
>
Nano Hybrids
> @scientific.net
CONFERENCE
6/16/2013 - 6/19/2013
The 7th International conference on Physical and Numerical Simulation of Materials Processing
5/16/2013 - 5/19/2013
2nd International Congress on Advanced Materials
4/13/2013 - 4/14/2013
2013 2nd lnternational Conference on lntclligent Materials, Applied Mechanics and Design Science (IMAMD 2013)
more...
Articles by keyword: «
Leakage Current
»
79 papers on 6 pages:
1
[2]
[3]
...
[6]
[next]
AlON/SiO
2
Stacked Gate Dielectrics for 4H-SiC MIS Devices
Published in:
Silicon Carbide and Related Materials 2008
(p541)
Analyses of High Leakage Currents in Al
+
Implanted 4H SiC pn Diodes Caused by Threading Screw Dislocations
Published in:
Silicon Carbide and Related Materials 2009
(p913)
Analysis of High Leakage Currents in 4H-SiC Schottky Barrier Diodes Using Optical Beam-Induced Current Measurements
Published in:
Silicon Carbide and Related Materials 2001
(p1141)
Analysis of Structural Defects in the 4H-SiC Epilayers and their Influence on the Electrical Properties
Published in:
Silicon Carbide and Related Materials 2003
(p1085)
Based on Fractal Theory of Insulator Leakage Current Data Compression
Published in:
Materials Science and Information Technology
(p5368)
Breakdown Voltage Improvement of 4H-SiC Schottky Diodes by a Thin Surface Implant
Published in:
Silicon Carbide and Related Materials - 1999
(p1211)
Challenges for Improving the Crystal Quality of 3C-SiC Verified with MOSFET Performance
Published in:
Silicon Carbide and Related Materials 2007
(p89)
Consideration of Uncertainty in Diagnosis for Railway Arrester
Published in:
Advanced Nondestructive Evaluation I
(p1507)
Correlation between Leakage Current and Stacking Fault Density of p-n Diodes Fabricated on 3C-SiC
Published in:
Silicon Carbide and Related Materials 2009
(p339)
Coupling between the Raman Spectroscopy and Photoemission Microscopy Techniques: Investigation of Defects in Biased 4H-SiC pin Diodes
Published in:
Silicon Carbide and Related Materials 2006
(p909)
Critical Density of Nanoscale Pits for Suppressing Variability in Leakage Current of a SiC Schottky Barrier Diode
Published in:
Silicon Carbide and Related Materials 2011
(p371)
Current Voltage Characteristics of High-Voltage 4H Silicon Carbide Diodes
Published in:
Silicon Carbide and Related Materials - 1999
(p1323)
Defects Study by Activation Energy Profile for Lowering Leakage Current in P-N Junction
Published in:
Eco-Materials Processing and Design XII
(p569)
Development of Sol-Gel MgO Thin Films for SiC Insulation Applications
Published in:
Silicon Carbide and Related Materials 2003
(p1373)
Diamond Vertical Schottky Barrier Diode with Al
2
O
3
Field Plate
Published in:
Silicon Carbide and Related Materials 2011
(p1319)
Username:
Password: