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Papers by Keyword: Line Widths

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Temperature-Dependent Widths of Infrared and Far-Infrared Absorption Lines of Oxygen in Silicon

Authors: Hiroshi Yamada-Kaneta

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Recent Measurements and Theory Relating to Impurity-Induced LVMS in GaP and GaAs

Authors: R.C. Newman, E.G. Grosche, M.J. Ashwin, B.R. Davidson, D.A. Robbie, R.S. Leigh, M.J.L. Sangster

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