Papers by Keyword: Magnetic Force Microscopy

Abstract: Fabrication of hard magnetic thin films is a key issue on the development of new micro electro mechanical systems. As the magnetically hard SmCo thin-films offer excellent intrinsic magnetic properties, such as moderate saturation magnetization, large magnetic anisotropy, and high Curie temperature, they are considered as a promising candidate to be used for novel MEMS applications. In this work, SmCo₅ thin films with Cu underlayer were grown onto Si (100) substrate at room temperature by RF magnetron sputtering technique. The samples were annealed at 400 ̊C and 500 ̊C under Ar atmosphere condition. Microstructural and magnetic properties of sputtered SmCo₅ thin films were investigated by a number of advanced characterization tools and techniques. Phase composition of SmCo₅ thin films was analyzed by grazing incident X-ray diffraction (GIXRD) with Cu-K_α radiation. Surface morphology was investigated by scanning electron microscopy (SEM) and atomic force microscopy (AFM) techniques. Magnetic force microscopy (MFM) technique was used to take stray-field images of SmCo₅ thin films, and finally magnetic properties were investigated to explain the coercivity of SmCo₅ thin films using superconducting quantum interference device (SQUID) as a magnetometer.

Abstract: The attractive action exerted by an array of micro-magnets on a single polystyrene microsphere containing superparamagnetic iron oxide nanoparticles, the microsphere constituting a model for cells functionalised with such nanoparticles, have been studied in air by using magnetic force microscopy. For this purpose, the method of gluing a magnetic microsphere to an AFM tip has been developed. Using this custom-made colloidal probe, the regions of the micro-magnet array that act as magnetic traps for the magnetic microsphere have been localized and the long-range trap-sphere interactions have been recorded, measured and compared with simulations.

Abstract: The computer processing of cobalt nanodots magnetic force microscopy was fulfilled. The solution of reverse task of magnetic force microscopy is obtained for surface nanosystems. Superposition of fields, which are generated by a system of magnetic moments in the selected point in space, causes a linear dependence of the force gradient of the dipole-dipole interaction between the components of the vectors.