HOME CONTACT My eBook

Username: Password:

> @scientific.net

Articles by keyword: «Magnetic Resonance»

• Atomic Structure of Chalcogen-Hydrogen Complexes in Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology VIII (p583)
• Basic Study on Improving Power of Wireless Power Transfer via Magnetic Resonance Coupling
  Published in: Advanced Research on Industry, Information System and Material Engineering (p445)
• Behavior of Native Defects in Semi-Insulating 4H-SiC after High Temperature Anneals and Different Cool-Down Rates
  Published in: Silicon Carbide and Related Materials 2007 (p389)
• Characterisation of Hydrogen and Hydrogen-Related Centres in Crystalline Silicon by Magnetic-Resonance Spectroscopy
  Published in: Defect Interaction and Clustering in Semiconductors (p353)
• Defects in Semi-Insulating SiC Substrates
  Published in: Silicon Carbide and Related Materials - 2002 (p45)
• Defects Spectroscopy in ß-Ga₂O₃
  Published in: Defects in Semiconductors 19 (p1473)
• Definitive Identification of an Important 4H SiC MOSFET Interface/Near Interface Trap
  Published in: Silicon Carbide and Related Materials 2011 (p433)
• Electrically and Optically Detected Magnetic Resonance in GaN-Based LEDs
  Published in: Defects in Semiconductors 19 (p1105)
• Electrically Detected Magnetic Resonance Studies of Processing Variations in 4H SiC Based MOSFETs
  Published in: Silicon Carbide and Related Materials 2007 (p719)
• EPR Evidence of Hydrogen-Enhanced Diffusion of Aluminum in Silicon
  Published in: Defects in Semiconductors 19 (p1777)
• EPR Study of Platinum-Hydrogen Complexes in Silicon
  Published in: Defects in Semiconductors 17 (p1659)
• High-Field EPR Spectroscopy of Thermal Donors in Silicon
  Published in: Defects in Semiconductors 19 (p373)
• Hydrogen Interaction with Transition Metals in Silicon, Studied by Electron Paramagnetic Resonance
  Published in: Gettering anf Defect Engineering in Semiconductor Technology IX (p133)
• Hydrogen Passivation of the Sulfur Double Donor in Silicon Investigated by EPR and ENDOR
  Published in: Defects in Semiconductors 18 (p855)
• Magnetic Properties of Frustrated CMR FeCr₂S₄ Ferrimagnet
  Published in: EMMA-2000 (p513)