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Articles by keyword: «Mapping»

• 3-D Mapping of Strain and Defects in a ZnSE Epilayer Using a Variable Energy Electron Beam
  Published in: II-VI Compounds and Semimagnetic Semiconductors (p163)
• A Solution about Shifted of the Involute Spline Base on some Mechanical Transmission
  Published in: Mechanical and Aerospace Engineering (p1594)
• A Survey of Meta-Heuristic Solution Methods for Mapping Problem in Network-on-Chips
  Published in: MEMS, NANO and Smart Systems (p3994)
• Adaptive Line Extraction for Slam Line Based Applications in Unknown Environments
  Published in: MEMS, NANO and Smart Systems (p2057)
• Architecture-Specific Mapping Tool for SOI-Based FPGA
  Published in: Micro Nano Devices, Structure and Computing Systems (p438)
• Characterization of Deep Levels in SiC by Photoluminescence Spectroscopy and Mapping
  Published in: Silicon Carbide, III-Nitrides and Related Materials (p481)
• Characterization of SiC Epitaxial Wafers by Photoluminescence under Deep UV Excitation
  Published in: Silicon Carbide and Related Materials 2001 (p597)
• Characterization of SiC Substrates Using X-Ray Rocking Curve Mapping
  Published in: Silicon Carbide and Related Materials 2005 (p729)
• Characterization of SiC Wafers by Photoluminescence Mapping
  Published in: Silicon Carbide and Related Materials 2005 (p711)
• Comparison of Efficiencies of Different Surface Passivations Applied to Crystalline Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology XI (p585)
• Correlation between Room Temperature Photoluminescence and Resistivity in Semiinsulating Silicon Carbide
  Published in: Silicon Carbide and Related Materials 2005 (p717)
• Detection of Groundwater Aquifer Using Resistivity Imaging Profiling at Beriah Landfill Site, Perak, Malaysia
  Published in: Advanced Building Materials (p1852)
• Development of Metallic Glasses by Semi-Empirical Calculation Method
  Published in: ISMANAM-2004 (p283)
• Growth and Characterisation of SiC Power Device Material
  Published in: Silicon Carbide, III-Nitrides and Related Materials (p97)
• High Frequency Dielectric Permittivity Measurement of Dielectric Layer of MLCC Using Non-Contact Probe
  Published in: Electroceramics in Japan X (p243)