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Articles by keyword: «Mechanical Stress»

• Applicability of the Crystallite Group Method to Fibre Textured Specimens
  Published in: European Powder Diffraction EPDIC 8 (p131)
• Application of the Positron Lifetime Spectroscopy as a Method of Non-Destructive Testing
  Published in: Positron Annihilation - ICPA-10 (p989)
• Compositional and Stress-Sensitive Factors during the Thermopower Characterization of Single Phase Crystalline and Glassy Alloys
  Published in: Materials Science, Testing and Informatics V (p343)
• Dislocation Generation in Device Fabrication Process
  Published in: Gettering and Defect Engineering in Semiconductor Technology X (p439)
• Dynamical Study of Dislocations and 4H → 3C Transformation Induced by Stress in (11-20) 4H-SiC
  Published in: Silicon Carbide and Related Materials 2004 (p299)
• Effect of Mechanical Stresses on the Coercive Force of the Heterophase Non-Interacting Nanoparticles
  Published in: Advanced Manufacturing Technology (p2199)
• Grain Boundary Engineering by Application of Mechanical Stresses
  Published in: Recrystallization and Grain Growth III (p987)
• In Situ Growth-Stress Measurement of Cr₂O₃ Scale Formed on Stainless Steels by Raman Spectroscopy
  Published in: High-Temperature Oxidation and Corrosion 2005 (p489)
• Influence of Magnetic Field and Stress on Large Magnetic Shape Memory Effect in Single Crystalline Ni-Mn-Ga Ferromagnetic Alloy at Room Temperature
  Published in: EMMA-2000 (p341)
• Mechanical Loading of R-R-T Dyade
  Published in: Advanced Materials Research II (p1272)
• Mechanical Properties of Thin and Thick Polysilicon Films for Microsystem Applications
  Published in: Polycrystalline Semiconductors VI (p405)
• Mechanical Stresses due to Co Precipitation in Granular AgCo Films
  Published in: Diffusion and Stresses (p181)
• Stress Measurements in sub-μm Si Structures Using Raman Spectroscopy
  Published in: Beam Injection Assessment of Defects in Semiconductors (p519)
• The Effect of Mechanical Stress on Barkhausen Noise from Heat-Treated Permalloy Plates
  Published in: Advances in Fracture and Damage Mechanics VII (p357)
• The Influence of Gate Material, SiO₂ Fabrication Method and Gate Edge Effect on Interface Trap Density in 3C-SiC MOS Capacitors
  Published in: HeteroSiC & WASMPE 2011 (p109)