| Paper Title | Page |
|---|---|
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A Theoretical and Experimental Study of Damage-Free BEOL Cleaning with Megasonic Agitation Authors: Jeffrey M. Lauerhaas, Yi Wu, Mario Bran, Brian Fraser, Eric Brause, Tom Nicolosi |
151 |
|
Authors: Yang Lae Lee, Eui Su Lim, Kook Jin Kang, Hyun Se Kim, Tae Gon Kim, Sang Ho Lee, Jin Goo Park |
229 |
|
Behaviour of a Well-Designed Megasonic Cleaning System Authors: Alexander Lippert, P. Engesser, Garry Ferrell, J. Klitzke, Martin Köffler, Franz Kumnig, Jörg Leberzammer, Alexander Pfeuffer, Rainer Obweger, Harry Sax, Harald Okorn-Schmidt |
155 |
|
Development of a Megasonic System for Cleaning Flat Panel Display Authors: Hyun Se Kim, Yang Lae Lee, Eui Su Lim, Menachem Elimelech |
181 |
|
Development of a Near-Field Megasonic Cleaning System for Nano-Particle Removal Authors: Hyun Se Kim, Yang Lae Lee, Eui Su Lim |
205 |
|
Authors: J. Desagher, D. Dussault, M. Beck, R. Lillard, Eric Liebscher |
201 |
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Evaluation of Very Dilute Alkaline Solutions for Wafer Cleaning with Megasonic Irradiation Authors: Ji Hyun Jeong, Bong Kyun Kang, Min Su Kim, Hong Seong Sohn, Ahmed A. Busnaina, Jin Goo Park |
181 |
|
Authors: Frank Holsteyns, Tom Janssens, Sophia Arnauts, Wouter Van der Putte, Vincent Minsier, Johann Brunner, Joachim Straka, Paul W. Mertens |
201 |
|
High Efficiency Single Wafer Cleaning for Wafer Bonding-Based 3D Integration Applications Authors: D. Dussault, F. Fournel, V. Dragoi |
269 |
|
High Speed Imaging of 1 MHz Driven Microbubbles in Contact with a Rigid Wall Authors: Aaldert Zijlstra, Tom Janssens, Kurt Wostyn, Michel Versluis, Paul W. Mertens, Detlef Lohse |
7 |