HOME CONTACT My eBook

Username: Password:

> @scientific.net

Articles by keyword: «Metrology»

• 3D-Characterisation of Sheet Metal and Roller Surfaces by Means of Confocal Microscopy
  Published in: Sheet Metal 2005 (p543)
• Assessment of the Ukrainian Quality Infrastructure: Challenges Imposed by the WTO and Commitments to EU Accession
  Published in: Measurement Technology and Intelligent Instruments IX (p611)
• Correlation Study between a New Interferometric Asphere Metrology System and Fizeau Interferometer
  Published in: Optics Design and Precision Manufacturing Technologies (p1142)
• Design for the High-Rise Cable-Suspended Rescue Robot
  Published in: Manufacturing Science and Technology (p1562)
• Developments in Homodyne Interferometry
  Published in: Measurement Technology and Intelligent Instruments IX (p84)
• Error Analysis of Absolute Interferometric Testing Based on Reconstruction of Rotational Shear
  Published in: Sustainable Construction Materials and Computer Engineering (p620)
• Estimation of Uncertainty of Coordinate Measurements According to the Type B Method
  Published in: Measurement Technology and Intelligent Instruments IX (p253)
• Fabrication of Carbon Nanotube Probes in Atomic Force Microscopy
  Published in: Advances in Abrasive Technology XII (p497)
• Fast Non-Contact Dielectric Characterization for SiC MOS Processing
  Published in: Silicon Carbide and Related Materials 2005 (p1035)
• Improving Fuel Cell Industry by Constructing Metrological Traceability
  Published in: Innovation in Materials Science and Emerging Technology (p334)
• Inclination Errors Evaluation of Planar Lines with a Chaos Optimization
  Published in: Advances in Engineering Design and Optimization (p525)
• In-Line Phase and Texture Control in Microelectronics Industry
  Published in: Textures of Materials - ICOTOM 14 (p1343)
• Issues with Body Mass Measurement on the International Space Station (ISS)
  Published in: Precision Instrumentation and Measurement (p9)
• Mass Measurement in Space, 1964-2010
  Published in: Precision Instrumentation and Measurement (p1)
• Micro-Photoluminescence Mapping of Defect Structures in SiC Wafers
  Published in: Silicon Carbide and Related Materials 2006 (p383)