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Articles by keyword: «Microdefect»

• Analysis of Minute StrainFields around Microdefects in Silicion Crystals by Plane-Wave X-Ray Topography
  Published in: Defect and Diffusion Forum Vols. 138-139 (p49)
• Defect Studies in Fe₃Al Alloys Doped with Cr, Mo and Si
  Published in: Positron Annihilation - ICPA-12 (p195)
• Delineation of Microdefects in Silicon Substrates by Chromium-Free Preferential Etching Solutions and Laser Scattering Tomography
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIII (p443)
• Development of an Evanescent Light Measurement System for Si Wafer Microdefect Detection
  Published in: Measurement Technology and Intelligent Instruments VI (p15)
• Effects of Nb and Mg on Microdefects in NiAl Alloys
  Published in: Positron Annihilation - ICPA-10 (p339)
• Effects of Stress Fields around Micro-Surface Defects on the Occurrence of Slip and Micro Cracks
  Published in: Fracture and Strength of Solids IV (p767)
• Gettering of Transition Metals in Multicrystalline Silicon
  Published in: Defects in Semiconductors 18 (p1979)
• Influence of Mn and Fe on Defects in NiAl Alloy Investigated by Positron Annihilation Techniques
  Published in: Positron Annihilation - ICPA-12 (p198)
• Integrated Approach for Modeling of Heat Transfer and Microdefect Formation during CZ Silicon Single Crystal Growth
  Published in: Gettering and Defect Engineering in Semiconductor Technology XII (p283)
• Intrinsic Point Defects and Grown-in Defects in Silicon
  Published in: Special Defects in Semiconducting Materials (p1)
• Investigations for the Detection of Microdefects in Cast Multicrystalline Silicon
  Published in: Polycrystalline Semiconductors IV (p87)
• Laser Beam Induced Current Characterization of High Efficiency Chalcopyrite Solar Cells
  Published in: Polycrystalline Semiconductors V (p69)
• Microdefects in Nitrogen Doped FZ Silicon Revealed by Li⁺ Drifting
  Published in: Defects in Semiconductors 18 (p1761)
• Microdefects in Polycrystalline Silicon
  Published in: Polycrystalline Semiconductors IV (p81)
• Optimization of Silicon Ingot Quality by the Numerical Prediction of Bulk Crystal Defects
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIII (p205)