| Paper Title | Page |
|---|---|
|
(PyC/SiC)n and (BN/SiC)n Nanoscale-Multilayered Interphases by Pressure Pulsed-CVI Authors: Sebastien Bertrand, O. Boisron, R. Pailler, Jacques Lamon, Roger R. Naslain |
357 |
|
128-Channel Silicon Strip Detector Installed at a Powder Diffractometer Authors: A. Zięba, W. Dąbrowski, P. Gryboś, W. Pawroźnik, J.R. Słowik, T. Stobiecki, K. Świentek, P. Wiącek |
175 |
|
A Thermomechanical Analysis of MCM-D Substrate of Polymer and Metal Multilayer Authors: Ji Ho Lim, Ji Soon Kim, Kyoung Wook Paik, Y.Y. Earmme |
1123 |
|
An Expert Software for Multi-Layer Coatings Design in Surface Engineering Authors: Céline Bondoux, Christophe Degrandcourt, George Ailinca, Pierre D'Ans, Marc Degrez, Denis Wathelet, François Barthelemy, Julie Anciaux, Gustavo Ospina, Jean Marie Jacquet |
583 |
|
Analysis of the Residual Stress in Multi-Layer Materials Authors: Kun Shi, Yuan Yuan, Feng Tao Wei |
377 |
|
Analytical Techniques in the Manufacture of Multilayer Ceramic Capacitors Authors: N. Carr |
351 |
|
Biodegradation of Multilayer Silk Fibroin and Hydroxyapatite Composite Material Authors: Rikako Kino, Toshiyuki Ikoma, Shunji Yunoki, Akira Monkawa, Atsushi Matsuda, Go Kagata, Tetsuo Asakura, Masanobu Munekata, Junzo Tanaka |
1169 |
|
Characterisation of Multilayers Crystallographic Texture Authors: A. Tizliouine, J. Bessières, J.J. Heizmann, J.F. Bobo |
227 |
|
Characterization of Ni80Fe20/Cu Multilayers by X-Ray Reflection Using Anomalous Scattering Authors: D.C. Meyer, K. Richter, B. Wehner, G. Reiss, L. van Loyen, P. Paufler |
451 |
|
Co/Si/W/Si Multilayers with Enhanced Thermal Stability for Soft X-Ray and UV Optics Authors: Matej Jergel, A. Anopchenko, Š. Luby, E. Majková, R. Senderák, V. Holý |
364 |