HOME CONTACT My eBook

Username: Password:

> @scientific.net

Articles by keyword: «Multicrystalline Silicon»

• 17.0% Aperture Area Module Efficiency Using Large mc-Si Metal-Wrap-Through Cells
  Published in: 5th FORUM ON NEW MATERIALS PART C (p124)
• An Express Method for the Study of Planar Homogeneity of Diffusion Lenght in Multicrystalline Solar Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIII (p449)
• Analysis of Heterogeneous Iron Precipitation in Multicrystalline Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIII (p27)
• Carbon-Induced Twinning in Multicrystalline Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology X (p181)
• Carrier Density Imaging as a Tool for Characterising the Electrical Activity of Defects in Pre-Processed Multicrystalline Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology X (p229)
• Crystalline Silicon Materials and Solar Cells
  Published in: Semiconductor Processing and Characterization with Lasers (p297)
• Depth Profiling of the Recombination Activity of Defects Measured by Temperature-Dependent Cross-Sectional EBIC
  Published in: Beam Injection Assessment of Microstructures in Semiconductors (p65)
• D-Line Emission from Small Angle Grain Boundaries in Multicrystalline Si
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIII (p561)
• Effect of the Si₃N₄ Coating on the Mc-Si Ingot in the Process of Multicrystalline Silicon Purification by Metallurgical Methods
  Published in: Advanced Material Science and Technology (p1311)
• Effective Gettering Mechanisms in Solar Multicrystalline Materials
  Published in: Gettering anf Defect Engineering in Semiconductor Technology IX (p719)
• Effects of Molecular Hydrogen on Electrical Properties of Multicrystalline Silicon Grain Boundaries
  Published in: Physical Chemistry of Solid State Materials (p531)
• Electrical Behaviour of Crystal Defects in Silicon Solar Cells
  Published in: Beam Injection Assessment of Microstructures in Semiconductors (p39)
• Estimation of the Upper Limit of the Minority-Carrier Diffusion Length in Multicrystalline Silicon: Limitation of the Action of Gettering and Passivation on Dislocations
  Published in: Gettering and Defect Engineering in Semiconductor Technology X (p197)
• Experimental Study of the Silicon Start-up Heating and Melting Process in an Inductive Cold Crucible
  Published in: Materials Processing Technologies (p756)
• Gettering of Transition Metals in Multicrystalline Silicon
  Published in: Defects in Semiconductors 18 (p1979)