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Articles by keyword: «Nickel Silicide»

• 3.3 kV Rated Silicon Carbide Schottky Diodes with Epitaxial Field Stop Ring
  Published in: Silicon Carbide and Related Materials 2010 (p555)
• Dependence of Strain Rate and Environment on the Mechanical Properties of the Ni-19Si-3Nb-1Cr-0.2B Intermetallic Alloy at High Temperature
  Published in: PRICM 6 (p419)
• Diffusion and Redistribution of Boron in Nickel Silicides
  Published in: Diffusion in Materials - DIMAT 2011 (p415)
• Effect of Cr Additives on the Microstructures and Properties of Laser Cladded Ni₃Si
  Published in: High-Performance Ceramics V (p1319)
• Effect of Pt Interlayer on Thermal Stability of NiSi Films
  Published in: PRICM-5 (p3795)
• Effect of SiO₂ Cap Layer on Thermal Stability of Nickel and Nickel-Cobalt Silicide
  Published in: Advanced Nondestructive Evaluation I (p1322)
• Electrical Characterization of Inhomogeneous Ni₂/Si/SiC Schottky Contacts
  Published in: Silicon Carbide and Related Materials 2003 (p869)
• Formation of High Density Metal Silicide Nanodots on Ultrathin SiO₂ for Floating Gate Memory Application
  Published in: THERMEC 2009 (p1725)
• From Contact to Diffusion Controlled Growth of Nickel Silicides in Silicon Nanowires
  Published in: Diffusion in Materials - DIMAT 2011 (p427)
• High Temperature Operation of Silicon Carbide Schottky Diodes with Recoverable Avalanche Breakdown
  Published in: Silicon Carbide and Related Materials 2005 (p931)
• Impact of Hydrogenation on Electrical Properties of NiSi₂ Precipitates in Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology XI (p279)
• Impact of NiSi₂ Precipitates Electronic Structure on the Minority Carrier Lifetime in n-and p-Type Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology XII (p155)
• Implementing an In Situ Surface Preparation Prior to Ni Deposition for Ni Salicide Processes
  Published in: Ultra Clean Processing of Semiconductor Surfaces VIII (p19)
• Influence of the Annealing Temperature on the Precipitation of Nickel in a ∑=25 Silicon Bicrystal
  Published in: Intergranular and Interphase Boundaries in Materials (p669)
• In-Line Phase and Texture Control in Microelectronics Industry
  Published in: Textures of Materials - ICOTOM 14 (p1343)