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Articles by keyword: «Nonvolatile Memory»

• Amorphous IGZO Nonvolatile Memory Thin Film Transistors Using Ta₂O₅ Gate Dielectric
  Published in: Nanotechnology and Advanced Materials (p233)
• Blue Photoluminescence from Quantum Size Silicon Nanopowder
  Published in: Gettering and Defect Engineering in Semiconductor Technology XI (p65)
• Characterization of Non-Equilibrium Charge of MOS Capacitors on p-Type 4H SiC
  Published in: Silicon Carbide and Related Materials 2003 (p1365)
• Charge Storage Characteristics of Si-Rich Silicon Nitride and the Effect of Tunneling Thickness on Nonvolatile Memory Performance
  Published in: Liquid Crystals and Related Materials II (p307)
• Current Status of Graphene Transistors
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIII (p499)
• Dependency of Electrical Characteristics on Au Nano-Crystal Size for Non-Volatile Memory Fabricated with Au Nano-Crystal Embedded in PVK(Poly(N-Vinylcarbazole)) Layer
  Published in: Advances in Nanomaterials and Processing (p33)
• Effect of Various Electrode Materials in Non-Volatile Memory Device Using Poly(3,4-Ethylenedioxythiophene):Poly(Styrenesulfonate) (PEDOT:PSS) Thin Films
  Published in: Smart Materials & Micro/Nanosystems (p470)
• Effect of Varying Memory Device Architectures on the Electrical Properties of P(VDF/TrFE)(72/28) Copolymer Thin Film
  Published in: Smart Materials & Micro/Nanosystems (p491)
• Energy Band Engineering of Metal Nanodots for High Performance Nonvolatile Memory Application
  Published in: Technology Evolution for Silicon Nano-Electronics (p140)
• Gate Materials and Fabrication-Processes of Metal-Ferroelectric-Insulator-Semiconductor Memory FETs with Long Data Retention
  Published in: 11th International Ceramics Congress (p2382)
• Laser Assisted Formation on Nanocrystals in Plasma-Chemical Deposited SiN_x Films
  Published in: Gettering and Defect Engineering in Semiconductor Technology XI (p53)
• Monitoring of Defects in Thermal Oxides during Electrical Stress
  Published in: Gettering anf Defect Engineering in Semiconductor Technology IX (p237)
• Nanocrystal Non-Volatile Memory Devices
  Published in: Thin Films and Porous Materials (p1)
• Nanocrystals in High-k Dielectric Stacks for Non-Volatile Memory Applications
  Published in: Disclosing Materials at the Nanoscale (p156)
• Photoinduced Variation of Capacitance Characteristics of MDS Structures with Three-Layer SiN_x Dielectrics
  Published in: Gettering and Defect Engineering in Semiconductor Technology XII (p461)