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Articles by keyword: «Oxide Precipitates»

• Detection of Nickel in Silicon by Recombination Lifetime Measurements
  Published in: Gettering and Defect Engineering in Semiconductor Technology XII (p183)
• Mechanism of Slip Dislocation Generation by Oxide Precipitates in Czochralski Silicon Wafers
  Published in: Gettering and Defect Engineering in Semiconductor Technology VII (p137)
• On the Interaction of Dislocations with Impurities in Silicon
  Published in: Defects and Diffusion in Semiconductors - an Annual Retrospective VIII (p15)
• Oxygen Precipitation Studied by X-Ray Diffraction Techniques
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIV (p325)
• Phonon Scattering in Heat-Treated Cz-Silicon
  Published in: Defects in Semiconductors 19 (p399)
• Re-Dissolution of Gettered Iron Impurities in Czochralski-Grown Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology X (p577)
• The Spatial Distribution of SiO₂ Precipitates Grown in Silicon at Laser Induced Centres
  Published in: Gettering and Defect Engineering in Semiconductor Technology VIII (p339)