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Articles by keyword: «Photocurrent»

• Analysis on the Passive Films of Fe, Cr and Fe-25Cr Alloy by Photo-Electrochemical Methods
  Published in: Electrochemical Methods in Corrosion Research VI (p1119)
• Characteristics of Visible-Light Enabled TiO₂/ITO Films
  Published in: Advanced Materials Research (p152)
• Characterization of EL2 in Annealed LT-GaAs
  Published in: Defects in Semiconductors 17 (p1599)
• Effect of Ge Nanoislands on Lateral Photoconductivity of Ge-SiO_X-Si Structures
  Published in: Nanoscaled Semiconductor-on-Insulator Materials, Sensors and Devices (p179)
• Effects of Trapping in a-Si:H Diodes
  Published in: Hydrogenated Amorphous Silicon (p957)
• Electrochemical Synthesis of POT for Electrochromic and Solar Cell Materials
  Published in: New Materials, Applications and Processes (p1002)
• Film Initiation and Growth in Electropolymerisation
  Published in: New Materials (p219)
• Holes Induced by Strong Near Band Gap Light in GaAs:O. EL2 Related?
  Published in: Defects in Semiconductors 18 (p1043)
• Homogeneity of Fe-Doped InP Wafers Using Optical Microprobes
  Published in: Defects in Semiconductors 19 (p825)
• In-Situ Imaging of Corrosion Processes
  Published in: Electrochemical Methods in Corrosion Research V (p693)
• Investigation of Anodic Passive Layers on Tin-Indium Alloys by Photocurrent and Electrochemical Impedance Spectroscopies
  Published in: Electrochemical Methods in Corrosion Research V (p711)
• I-V Characteristics for Bifacial Silicon Solar Cell under a Magnetic Field
  Published in: Advances in Materials and Systems Technologies (p303)
• Magnetic Field Effects on Current, Electroluminescence and Photocurrent in Alq₃ Organic Light Emitting Diodes
  Published in: Spin Injection and Transport in Magnetoelectronics (p53)
• Organic Photovoltaic Cells Prepared with Toluene Sulfonic Acid Doped Polypyrrole
  Published in: Advances in Liquid Crystals (p450)
• Photocurrent and Photoluminescence of Amorphous Silicon Nanoclusters Embedded in Silicon Suboxide Matrix
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIV (p465)