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Articles by keyword: «Point Defect»

• Comparative Ab Initio Study of Point Defect Energies and Atom Migration Profiles in the L1₂-Ordered Intermetallic Compounds Ni₃Al, Ni₃Ga, Pt₃Ga, Pt₃In
  Published in: Diffusion in Materials - DIMAT2004 (p133)
• Comparison of Positron-Lifetime Spectroscopy and Differential-Dilatometric Measurements of Equilibrium Vacancies in Copper and α-CuGe Alloys
  Published in: Positron Annihilation - ICPA-9 (p1097)
• Computer Simulation of the Diffusion in Binary Fe-Cu Alloys
  Published in: Diffusion in Materials DIMAT 1996 (p505)
• Computer Simulation Study of the Precipitate-Matrix Interface in an Fe-Cu System
  Published in: Intergranular and Interphase Boundaries in Materials (p409)
• Control of Size and Density of Stacking Fault in Silicon by Gold Diffusion
  Published in: Defects in Semiconductors 17 (p1523)
• Current Problems of Defects in Semiconductors – Interaction of Defects with Impurities
  Published in: Positron Annihilation - ICPA-9 (p139)
• Cyclic Spectrum Analysis on Rolling-Element Bearing with Inner-Race Point Defect
  Published in: Materials Processing Technology (p1469)
• Damping Properties of SMA
  Published in: Advances in Shape Memory Materials (p85)
• Decrease of Point Defect Concentration at a Surface of ZnO/Si Heterostructure by Powerful Laser Radiation
  Published in: Global Research and Education (p158)
• Deep Level Point Defects in Semi-Insulating SiC
  Published in: Silicon Carbide and Related Materials 2005 (p517)
• Defect Characterization of II-VI Compound Semiconductors Using Positron Lifetime Spectroscopy
  Published in: Defects in Semiconductors 19 (p1335)
• Defect Level of the Carbon Vacancy-Carbon Antisite Pair Center in SI 4H SiC
  Published in: Silicon Carbide and Related Materials 2007 (p385)
• Defect Production and Annealing in Degenerate Silicon Irradiated with fast Electrons at Low Temperatures
  Published in: Defects in Semiconductors 18 (p151)
• Defect Properties of Beryllium Oxide
  Published in: Defects in Insulating Materials (p51)
• Defect Structure and Electrical Properties of Cr- and Nb-Doped TiO₂ Thin Films
  Published in: Systems with Fast Ionic Transport - IV (p135)