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Articles by keyword: «Positron Annihilation Spectroscopy»

• Atomic Defects in AlPdMn: A Study by Means of Positron Annihilation Spectroscopy
  Published in: Positron Annihilation - ICPA-12 (p179)
• Comparison of Defect Structures in Fe-Cu Alloys by High-Speed and Low-Speed Deformation with the Detection of Cu Precipitates
  Published in: Positron Annihilation - ICPA-13 (p117)
• Correlation of Mechanical Properties with Defect Structure in Commercial Pure Al and Al-Mn Alloys Studied by Positron Annihilation Spectroscopy
  Published in: Progress in Light Metals, Aerospace Materials and Superconductors (p783)
• Defects in Martensitic Stainless Steel 1.4031 (EN) Exposed to Friction as Seen by Positron Annihilation
  Published in: Progress in Positron Annihilation (p46)
• Depth of Electron Traps in N-Alkanes
  Published in: Progress in Positron Annihilation (p89)
• Effect of Irradiation Doses on AlCu_6.5 Alloy Using Positron Annihilation Doppler Broadening Technique
  Published in: Defects and Diffusion in Metals (p15)
• Effect of Mn on the Nanoprecipitation in Binary Fe-Cu alloys
  Published in: Solid-Solid Phase Transformations in Inorganic Materials (p297)
• Electrical and Structural Properties of Al and B Implanted 4H-SiC
  Published in: Silicon Carbide and Related Materials - 1999 (p909)
• Electron Irradiation Induced Vacancy Defects Detected by Positron Annihilation in 6H-SiC
  Published in: Silicon Carbide and Related Materials 2004 (p473)
• Hydrogen Bonded Supra Molecular Structure as Studied by Positron Annihilation Spectroscopy
  Published in: Positron and Positronium Chemistry (p227)
• Investigation of Ion-Impantation Induced Damage in 6H-SiC by RSB/C and PAS
  Published in: Silicon Carbide, III-Nitrides and Related Materials (p729)
• Momentum Density of High T_c Copper Oxides
  Published in: Positron Annihilation - ICPA-11 (p189)
• Neutron Irradiated Copper: Is the Main Positron Lifetime Component due to Stacking Fault Tetrahedra?
  Published in: Positron Annihilation - ICPA-13 (p21)
• Oxygen Enrichment of Silicon Wafer by Ion Implantation Method and Fabrication of Surface Barrier Detectors
  Published in: Defects and Diffusion in Semiconductors - an Annual Retrospective VIII (p23)
• Positron Annihilation Measurements in Zirconium at High Temperatures
  Published in: Nondestructive Characterization of Materials VII (p735)