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Articles by keyword: «Profile»

• A 3D Slab Method in Cold Strip Rolling
  Published in: Progress on Advanced Manufacture for Micro/Nano Technology 2005 (p1279)
• A Finite Difference Calculation of Impurity Migration in Semiconductors by the Kick-Out Mechanism
  Published in: Defects and Diffusion in Semiconductors (p89)
• A Simple Method for Determining the Bascie Diffusion Parameters of Dopants using an Analytical Form of the Concentration Profile
  Published in: Defects and Diffusion in Semiconductors (p113)
• AES Study of the GaAs-Germanium Oxynitride Interface
  Published in: Passivation of Metals and Semiconductors (p165)
• Analytical In-Diffusion Profiles of Dopants in Semiconductors
  Published in: Defects and Diffusion in Semiconductors (p231)
• Analytical Studies of Diffusion by the Dissociative Mechanism in the Case of a Foreign Atom Source
  Published in: Defects and Diffusion in Metals An Annual Retrospective - VII (p15)
• Application Research Color Management in the Transfer Printing Based on the Linear Regression Algorithm
  Published in: Frontiers of Manufacturing and Design Science II (p1932)
• Design of Milling Cutter for Machining Helical Curved Surfaces
  Published in: Frontiers of Manufacturing and Design Science (p748)
• Effect of Conservation Cultivation on Accumulation and Distribution of Soil Organic Carbon in Paddy Fields Located in Southwest China
  Published in: Smart Materials and Intelligent Systems (p40)
• Fatigue Properties of Welded T-Joints in Thin-Walled Aluminium Profiles
  Published in: Aluminium Alloys - ICAA5 (p1727)
• Finite Element Simulation for Evolutions of Profiles during Hot Compression
  Published in: Physical and Numerical Simulation of Materials Processing (p616)
• Fractal Analysis of Fracture Surfaces of Steel Charpy Specimens
  Published in: Advances in Strength of Materials (p43)
• Fuzzy Control in Profile Envelope Process of Form Cutter for Involute Gear and its Movement Control
  Published in: Precision Surface Finishing and Deburring Technology (p265)
• Hydroforging of Thick-Walled Hollow Aluminum Profiles
  Published in: Material Forming ESAFORM 2012 (p181)
• In-Diffusion Concentration Profiles of Dopants in Semiconductors
  Published in: Defects and Diffusion in Semiconductors (p109)