Scientific.Net: Materials Science

Paper Title	Page
A New Algorithm with Distance Constraint for Large-Scale Profile Measurement Authors: Yong Qiang Wang, Nai Guang Lu, Wen Yi Deng, Ming Li Dong	159
A Non-Contact Displacement Sensor with Diffraction Grating Metrology System for Profile Measurement Authors: Yu Rong Chen, Xu Dong Yang, Tie Bang Xie	74
Application of Radius Error Compensation Principle in the Profile Measuring Instrument Authors: Jun Feng Wang, Fu Gui Ma	923
Design of Digital Filters for Si Wafer Surface Profile Measurement - Denoising by Total Variation Authors: Hirotaka Ojima, Kazutaka Nonomura, Li Bo Zhou, Jun Shimizu, Teppei Onuki	332
Design of Digital Filters for Si Wafer Surface Profile Measurement – Noise Reduction by Lifting Scheme Wavelet Transform Authors: Kazutaka Nonomura, Masashi Ono, Li Bo Zhou, Jun Shimizu, Hirotaka Ojima	732
Design of Digital Filters for Si Wafer Surface Profile Measurement - Noise Reduction by Wavelet Transform - Authors: Masashi Ono, Kazutaka Nonomura, Li Bo Zhou, Jun Shimizu	544
Online Measurement of Micro-Aspheric Surface Profile with Compensation of Scanning Error Authors: Yoshikazu Arai, Atsushi Shibuya, Y. Yoshikawa, Wei Gao	175
Parameter Determination of Multiple Probes Scanning Method for Profile Measurement Authors: Xin Chen, Guo Qing Ding, Li Hua Lei, Yuan Li	1707
Photogrammetric Method with Distance Constraint for Profile of Inflatable Space Antenna Authors: Wen Yi Deng, Ming Li Dong, Nai Guang Lu, Y.Q. Wang	313
Profile Measurement of Large Aspheric Optical Surface by Scanning Deflectometry with Rotatable Optical Devices - Error Analysis and Pre-Experiment- Authors: Mu Zheng Xiao, Satomi Jujo, Satoru Takahashi, Kiyoshi Takamasu	604

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