Keyword: "Profile Measurement"
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Paper Title Page

A New Algorithm with Distance Constraint for Large-Scale Profile Measurement

Authors: Yong Qiang Wang, Nai Guang Lu, Wen Yi Deng, Ming Li Dong

159

A Non-Contact Displacement Sensor with Diffraction Grating Metrology System for Profile Measurement

Authors: Yu Rong Chen, Xu Dong Yang, Tie Bang Xie

74

Application of Radius Error Compensation Principle in the Profile Measuring Instrument

Authors: Jun Feng Wang, Fu Gui Ma

923

Design of Digital Filters for Si Wafer Surface Profile Measurement - Denoising by Total Variation

Authors: Hirotaka Ojima, Kazutaka Nonomura, Li Bo Zhou, Jun Shimizu, Teppei Onuki

332

Design of Digital Filters for Si Wafer Surface Profile Measurement – Noise Reduction by Lifting Scheme Wavelet Transform

Authors: Kazutaka Nonomura, Masashi Ono, Li Bo Zhou, Jun Shimizu, Hirotaka Ojima

732

Design of Digital Filters for Si Wafer Surface Profile Measurement - Noise Reduction by Wavelet Transform -

Authors: Masashi Ono, Kazutaka Nonomura, Li Bo Zhou, Jun Shimizu

544

Online Measurement of Micro-Aspheric Surface Profile with Compensation of Scanning Error

Authors: Yoshikazu Arai, Atsushi Shibuya, Y. Yoshikawa, Wei Gao

175

Parameter Determination of Multiple Probes Scanning Method for Profile Measurement

Authors: Xin Chen, Guo Qing Ding, Li Hua Lei, Yuan Li

1707

Photogrammetric Method with Distance Constraint for Profile of Inflatable Space Antenna

Authors: Wen Yi Deng, Ming Li Dong, Nai Guang Lu, Y.Q. Wang

313

Profile Measurement of Large Aspheric Optical Surface by Scanning Deflectometry with Rotatable Optical Devices - Error Analysis and Pre-Experiment-

Authors: Mu Zheng Xiao, Satomi Jujo, Satoru Takahashi, Kiyoshi Takamasu

604

Showing 1 to 10 of 14 Papers