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Articles by keyword: «Profile Measurement»

• A New Algorithm with Distance Constraint for Large-Scale Profile Measurement
  Published in: Experimental Mechanics in Nano and Biotechnology (p159)
• A Non-Contact Displacement Sensor with Diffraction Grating Metrology System for Profile Measurement
  Published in: Optics Design and Precision Manufacturing Technologies (p74)
• Design of Digital Filters for Si Wafer Surface Profile Measurement – Noise Reduction by Lifting Scheme Wavelet Transform
  Published in: Advances in Abrasive Technology XIII (p732)
• Design of Digital Filters for Si Wafer Surface Profile Measurement - Noise Reduction by Wavelet Transform -
  Published in: Advances in Precision Engineering (p544)
• Online Measurement of Micro-Aspheric Surface Profile with Compensation of Scanning Error
  Published in: Measurement Technology and Intelligent Instruments VIII (p175)
• Parameter Determination of Multiple Probes Scanning Method for Profile Measurement
  Published in: Advanced Manufacturing Technology (p1707)
• Photogrammetric Method with Distance Constraint for Profile of Inflatable Space Antenna
  Published in: Measurement Technology and Intelligent Instruments VIII (p313)
• Profile Measurement of Large Aspheric Optical Surface by Scanning Deflectometry with Rotatable Optical Devices - Error Analysis and Pre-Experiment-
  Published in: Advances in Precision Engineering (p604)
• Theoretical Study on Self-Calibration for the Wide-Range Laser Auto-Collimation Method
  Published in: Measurement Technology and Intelligent Instruments VIII (p271)
• Uncertainty Estimation in Intelligent Coordinate and Profile Measurement
  Published in: Advances in Precision Engineering (p564)