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Articles by keyword: «RBS»

• A Novel Time Synchronization Algorithm Based on the Synchronizer on Wireless Sensor Network with Clustering Architecture
  Published in: Materials, Mechatronics and Automation (p217)
• Analysis of Aluminium Ion Implantation Damage into 6H-SiC Epilayers
  Published in: Silicon Carbide, III-Nitrides and Related Materials (p733)
• Au Diffusion in Polycrystalline CdTe Thin Films
  Published in: Diffusion in Materials DIMAT2000 (p755)
• Characterization of As Implanted Silicides by Frequency Noise Level Measurements
  Published in: Advanced Materials and Processes (p153)
• Characterization of CN_x/Si Using RBS, NRA and AES Techniques
  Published in: Laser and Plasma Applications in Materials Science (p67)
• Characterization of Excimer Laser Annealing of Arsenic Implanted Silicon
  Published in: Shallow Impurities in Semiconductors V (p237)
• Characterization of Mechanically Polished Surfaces of Single Crystalline 6H-SiC
  Published in: Silicon Carbide, III-Nitrides and Related Materials (p359)
• Combining RBS and FTIR Spectroscopy for the Ge Analysis in Si_1-xGe_x Single Crystals
  Published in: Materials Science Applications of Ion Beam Techniques (p377)
• Comparison of Al and Al/C Co-Implants in 4H-SiC Annealed with an AlN Cap
  Published in: Silicon Carbide and Related Materials 2001 (p819)
• Compositional Microanalysis of the Obtained Copper Silicide from an Annealed Ternary System Cu/Au/Si by Standard RBS, Microprobe PIXE, XRD and EDS
  Published in: Advances in Innovative Materials and Applications (p306)
• Creation of the DLC Layer by the Dual Beam IBAD Technique
  Published in: Materials Science Applications of Ion Beam Techniques (p221)
• Damage Evolution in Al-implanted 4H SiC
  Published in: Silicon Carbide and Related Materials - 1999 (p869)
• Damage Induced by Argon Ion Implantation in Cubic Zirconia
  Published in: Positron Annihilation - ICPA-12 (p514)
• Diamond-Like Carbon Formed by Plasma Immersion Ion Implantation and Deposition Technique on 304 Stainless Steel
  Published in: PIM & ASIP 2004 (p129)
• Diffusion Analysis of Rhenium in Graphite Using Rutherford Backscattering Spectroscopy
  Published in: Diffusion in Materials DIMAT2000 (p85)