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Articles by keyword: «Raman Spectroscopy»

• Characteristics of Nanosize Sn Powder Prepared by Spark Processing
  Published in: Experimental Mechanics in Nano and Biotechnology (p397)
• Characterization of Defects in Semi-Insulating 6H-SiC Substrates Using IR Thermal Imaging Camera
  Published in: Silicon Carbide and Related Materials 2009 (p559)
• Characterization of Homoepitaxial 4H-SiC Layer Grown from Silane/Propane System
  Published in: Silicon Carbide and Related Materials - 2002 (p165)
• Characterization of Semiconductor Films Epitaxially Grown on Thin Metal Oxide Buffer Layers
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIII (p467)
• Characterization of SiC Thin Film Obtained by Magnetron Reactive Sputtering: IBA, IR and Raman Studies
  Published in: Silicon Carbide and Related Materials 2004 (p287)
• Comparison of Deposited Polycrystalline Films and Crystallized Silicon from a-Si:H Films
  Published in: Polycrystalline Semiconductors VI (p127)
• Compositional Changes of Enamel and Dentine after Er:YAG Laser Irradiation
  Published in: Functionalized and Sensing Materials (p529)
• Confocal Raman Spectroscopic Analysis of Ceramic Hip Joints
  Published in: Bioceramics 18 (p1211)
• Confocal Raman Spectroscopic Analysis of Phase Transformation and Residual Stresses in Ce-TZP/Al₂O₃ Nanocomposite for Biomedical Applications
  Published in: Bioceramics 19 (p373)
• Contactless Measurement of the Thermal Conductivity of Thin SiC Layers
  Published in: Silicon Carbide, III-Nitrides and Related Materials (p657)
• Contributions of Raman Spectroscopy and Electrochemical Impedance to the Understanding of the Underpaint Corrosion Process of Zinc-Coated Steel Sheets
  Published in: Electrochemical Methods in Corrosion Research V (p779)
• Coordination of Thiocyanate Ions to Rare Earth Ions in Concentrated Aqueous Rare Earth Thiocyanate Solutions
  Published in: Rare Earths '98 (p494)
• Coupling between the Raman Spectroscopy and Photoemission Microscopy Techniques: Investigation of Defects in Biased 4H-SiC pin Diodes
  Published in: Silicon Carbide and Related Materials 2006 (p909)
• Cross-Sectional Micro-Raman Spectroscopy: A Tool for Structural Investigations of Thin Polytypic SiC Layers
  Published in: Silicon Carbide, III-Nitrides and Related Materials (p661)
• Crystal Quality Evaluation of 6H-SiC Layers Grown by Liquid Phase Epitaxy around Micropipes using Micro-Raman Scattering Spectroscopy
  Published in: Silicon Carbide and Related Materials 2003 (p633)