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Articles by keyword: «Reflectance»

• A Novel Method for Representation of Spectral Images Based on Color Matching Functions
  Published in: Advanced Materials Science and Technology (p410)
• A Study of Metameric Blacks for the Representation of Spectral Images
  Published in: Recent Trends in Materials and Mechanical Engineering Materials, Mechatronics and Automation (p1116)
• Analysis of Hyperspectral Images Based on PCA
  Published in: Sport Materials, Modelling and Simulation (p641)
• Deriving Optimum Visibility Range and Aerosol Loading from Urban Atmospheric Model in Malaysia
  Published in: Advances in Environmental Science and Engineering (p5784)
• Development of HUD Combiner for Automotive Windshield Application
  Published in: Sol-Gel Production (p97)
• Effect of Tantalum Addition on Optical Transmittance and Electrical Resistivity of TiN Thin Films Prepared by d.c. Magnetron Sputtering
  Published in: Euro Ceramics VII (p523)
• Effects of Paraffin Addition on Optical Properties and Self-Assembly of SiO₂ Photonic Crystal
  Published in: Advances in Nanomaterials and Processing (p611)
• Infrared Reflectance of Extremely Thin AlN Epi-Films Deposited on SiC Substrates
  Published in: Silicon Carbide, III-Nitrides and Related Materials (p649)
• Light Trapping Potential of Hexagonal Array Silicon Nanohole Structure for Solar Cell Application
  Published in: Renewable and Sustainable Energy II (p90)
• Modelling of Specular Reflection Infrared Spectra of Oxide Films for Microstructural Analysis
  Published in: Polycrystalline Semiconductors IV (p289)
• Modification of Faceplates by Selective Chemical Etchings
  Published in: Cross-Disciplinary Applied Research in Materials Science and Technology (p417)
• Optical and Photoelectrical Properties of Microcrystalline Silicon Layers in Relation to Structural Ordering
  Published in: Polycrystalline Semiconductors III (p387)
• Optoelectronic Properties of Cadmium Sulfide Thin Films Deposited by Thermal Evaporation Technique
  Published in: Advanced Materials XII (p177)
• Simulation Study on Anti-Reflective Effects for Different Submicron-Structures
  Published in: Advanced Manufacturing Technology (p123)
• Spatial Mapping of the Carrier Concentration and Mobility in SiC Wafers by Micro Fourier-Transform Infrared Spectroscopy
  Published in: Silicon Carbide and Related Materials 2001 (p621)