HOME CONTACT My eBook

Username: Password:

> @scientific.net

Articles by keyword: «Resolution»

• A Counter-Based DPWM Device with Resolution Extension
  Published in: Innovation in Materials Science and Emerging Technology (p593)
• A New Approach to Ultrasonic Image Reconstruction
  Published in: Nondestructive Characterization of Materials VII (p855)
• A Two-Step Resolution for Preparing Enantiopure (S)-Ethyl Nipecotate
  Published in: Biotechnology, Chemical and Materials Engineering (p559)
• Analysis on the Performance of Differential Confocal Pointing Signal
  Published in: Optics Design and Precision Manufacturing Technologies (p516)
• Application of Experimental Performance Criteria for Optimal Design of Angular Dispersive Powder Diffractometers
  Published in: European Powder Diffraction 6 (p156)
• Beam Injection Methods as Tools for Studying Extended Defects in Semiconductors: Characteristics and Capabilities
  Published in: Polycrystalline Semiconductors IV (p51)
• Design and Fabrication of Bi-Convex Variable Focusing Lens Arrays Using Liquid Crystal for Integral Photography
  Published in: Designing, Processing and Properties of Advanced Engineering Materials (p73)
• Design and Implementation of a S-Parameter Wafer Defect Scanner
  Published in: Positron Annihilation - ICPA-13 (p501)
• Design Principle and Error Analysis of a New Large-Range Ultrasonic Position and Orientation System Based on TDOA
  Published in: Advanced Materials and Engineering Materials (p1433)
• Fabrication and Precise Alignment of Electron Lenses in the Microcolumn Using the Laser Diffraction Pattern
  Published in: Eco-Materials Processing and Design XII (p589)
• High Frame Rate and High Resolution Imaging with Synthetic Aperture
  Published in: Advances in Nondestructive Evaluation (p168)
• High-Resolution EBSD Analysis of Deformed Material
  Published in: Textures of Materials - ICOTOM 13 (p535)
• Investigation on Crushing Kinetic Equation of Ball Milling of Quartz Powder
  Published in: Advanced Manufacturing Technology (p812)
• Nanorelief Measurements Errors for a White-Light Interferometer with Chromatic Aberrations
  Published in: Measurement Technology and Intelligent Instruments IX (p51)
• Neat Field Optics: Comeback of Light in Microscopy
  Published in: Beam Injection Assessment of Defects in Semiconductors (p251)