Keyword: "Rutherford Backscattering"
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Annealing Behavior of Defects in Multiple-Energy Nitrogen Implanted ZnO Bulk Single Crystal

Authors: K. Kuriyama, K. Matsumoto, M. Ooi, K. Kushida

1361

Corrosion Depth Profiles by Rutherford Backscattering Spectrometry and Synchrotron X-Ray Reflrectometry

Authors: E. Szilágyi, L. Bottyán, L. Deák, E. Gerdau, V.N. Gittsovich, A. Gróf, E. Kótai, O. Leupold, D.L. Nagy, V.G. Semenov

365

Damage Evolution and Recovery in Al-Implanted 4H-SiC

Authors: Yu Long Zhang, William J. Weber, Weilin Jiang, Anders Hallén, G. Possnert

815

Electrical and Structural Properties of Al-Implanted and Annealed 4H-SiC

Authors: M. Obernhofer, Michael Krieger, Frank Schmid, Heiko B. Weber, Gerhard Pensl, Adolf Schöner

343

Epitaxial Growth and Defect Microstructures of Vanadium Dioxide Thin Films on Sapphire Substrates

Authors: Z.P. Wu

137

Excimer Laser Annealing of Ion-Implanted 6H-Silicon Carbide

Authors: Y. Hishida, Masanori Watanabe, Koichi Nakashima, Osamu Eryu

873

He Ion Beam Channeling in Bi2Sr2CaCu2Oy Single Crystals and Iodine Intercalated Compounds IxBi2Sr2CaCu2Oy

Authors: Etsuro Sugimata, Kentaro Ohhashi, Shoichi Nasu, Shinji Nagata

259

Hydrogen Elastic Recoil Detection Depth Resolution and Sensitivity as a Function of Sample Composition

Authors: L.S. Wielunski, G.L. Harding, A. Bendavid

369

Ion Implantation Damage in Silicon Studied Using Slow Positrons, RBS and Infrared Absorption

Authors: P.J. Simpson, M. Vos, I.V. Mitchell, C. Wu, P.J. Schultz

1439

Ion-Beam Analysis of Solar-Cell Materials

Authors: H. Metzner

351

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