Papers by Keyword: SEM Investigation

Abstract: Abstract. In the present paper we attempt to study and explain the increased leakage currents in Schottky diodes with an integrated p-n-structure. By a scanning Kelvin probe method (vibrating capacitor) were obtained the local variations of surface contact potential difference (CPD) for the chips with large and small leakage currents. It is shown that samples with higher leakage currents have smaller surface potential barrier. The SEM investigations revealed that a critical role in increasing leakage currents play the dislocations penetrating from the substrate into the epitaxial layer.

Abstract: The improvement of the mechanical strength of a porous anode support (NiO/8YSZ) induced by the addition of 5 to 10v% of alumina platelets to the basic composition was studied. The results obtained proved that the addition of 10v% alumina platelets, Placor 6, to the NiO/8YSZ composition improved the bending strength of the sintered material by nearly 20%, without any significant effect on the electrochemical performance. Changes in the processing procedure also had a strong influence on the mechanical strength, which resulted in the mechanical strength being increased to more than 100 MPa.