HOME
CONTACT
My eBook
Username:
Password:
FULLTEXT SEARCH
NEW:
Advanced Search
MSF
>
Materials Science Forum
KEM
>
Key Engineering Materials
SSP
>
Solid State Phenomena
DDF
>
Defect and Diffusion Forum
AMM
>
Applied Mechanics and Materials
AMR
>
Advanced Materials Research
AST
>
Advances in Science and Technology
JNanoR
>
Journal of Nano Research
JBBTE
>
Journal of Biomimetics, Biomaterials, and Tissue Engineering
JMNM
>
Journal of Metastable and Nanocrystalline Materials
JERA
>
International Journal of Engineering Research in Africa
AEF
>
Advanced Engineering Forum
NH
>
Nano Hybrids
> @scientific.net
CONFERENCE
6/16/2013 - 6/19/2013
The 7th International conference on Physical and Numerical Simulation of Materials Processing
5/16/2013 - 5/19/2013
2nd International Congress on Advanced Materials
4/13/2013 - 4/14/2013
2013 2nd lnternational Conference on lntclligent Materials, Applied Mechanics and Design Science (IMAMD 2013)
more...
Articles by keyword: «
SIMS
»
143 papers on 10 pages:
1
[2]
[3]
...
[10]
[next]
26
Al Tracer Diffusion in Nominally Undoped Single Crystalline α-Al
2
O
3
Published in:
Diffusion in Materials - DIMAT 2011
(p75)
4H-SiC Oxide Characterization with SIMS Using a
13
C Tracer
Published in:
Silicon Carbide and Related Materials 2008
(p513)
A Comparison between Physical Simulations and Experimental Results in 4H-SiC MESFETs with Non-Constant Doping in the Channel and Buffer Layers
Published in:
Silicon Carbide and Related Materials 2000
(p699)
A Comparison of Transient Boron Diffusion in Silicon, Silicon Carbide and Diamond
Published in:
Silicon Carbide and Related Materials 2007
(p453)
Accurate CsM
+
SIMS Aluminum Dopant Profiling in SiC
Published in:
Silicon Carbide and Related Materials 2005
(p629)
Aluminum and Boron Diffusion into (1-100) Face SiC Substrates
Published in:
Silicon Carbide and Related Materials 2001
(p557)
Analysis of Aluminium Ion Implantation Damage into 6H-SiC Epilayers
Published in:
Silicon Carbide, III-Nitrides and Related Materials
(p733)
Anomalous Diffusion of Hg in CdTe
Published in:
II-VI Compounds and Semimagnetic Semiconductors
(p51)
Beryllium Implantation Doping of Silicon Carbide
Published in:
Silicon Carbide and Related Materials - 1999
(p953)
Boron Diffusion in Intrinsic, n-Type and p-Type 4H-SiC
Published in:
Silicon Carbide and Related Materials 2003
(p917)
Calibration Factor for Determination of Interstitial Oxygen Concentration in Germanium by Infrared Absorption
Published in:
Gettering and Defect Engineering in Semiconductor Technology XI
(p735)
Cation Mobility in Y
2
O
3
- and CaO-Stabilised ZrO
2
Studied by Tracer Diffusion and Mechanical Spectroscopy
Published in:
Diffusion in Materials DIMAT2000
(p1039)
Cation Transport in Stabilised Zirconias
Published in:
Defects and Diffusion in Ceramics - An Annual Retrospective VII
(p185)
Ceria-Zirconia Nanoparticles Doped with La or Gd: Effect of the Doping Cation on the Real Structure
Published in:
Doped Nanopowders
(p81)
Channeled Implants in 6H Silicon Carbide
Published in:
Silicon Carbide and Related Materials - 1999
(p889)
Username:
Password: