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Articles by keyword: «Scanning Probe Microscope»

• An Investigation on the 3D Micromachining Techniques Based on a SPM
  Published in: Advances in Abrasive Technology VI (p465)
• Characterisation of Surface Properties by a Multi-Function TPM
  Published in: Measurement Technology and Intelligent Instruments VI (p9)
• Compensation Doping of Polysilicon Films for Stable Integrated Circuit Resistors
  Published in: Polycrystalline Semiconductors IV (p561)
• Design and Orthogonality Correction of a Planar Scanner for an Atomic Force Microscope
  Published in: Experimental Mechanics in Nano and Biotechnology (p401)
• Fundamental Research on Generation of Nanostructure by Means of Local Anodic Oxidation
  Published in: Advances in Abrasive Technology XI (p424)
• Improvement in Oxide-Pattern Sizes Controllability on Scanning Probe Nanolithography
  Published in: Advances in Abrasive Technology XIII (p701)
• Nanoscale Imaging of CaCu₃Ti₄O₁₂ Dielectric Properties: The Role of Surface Defects
  Published in: Gettering and Defect Engineering in Semiconductor Technology XII (p443)
• Observation of the Tensile Deformation Behavior of Polycrystalline Titanium with the Scanning Probe Microscope
  Published in: Engineering Plasticity from Macroscale to Nanoscale (p529)
• Optimum KOH Wet Etching of Cantilever Tip for Better Image Captured by Nanoeducator
  Published in: Green Power, Materials and Manufacturing Technology and Applications (p392)