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Articles by keyword: «Schottky Barrier»

• 4H-SiC CVD Epitaxial Layers with Improved Structural Quality Grown on SiC Wafers with Reduced Micropipe Density
  Published in: Silicon Carbide and Related Materials - 1999 (p505)
• 4H-SiC Schottky Diodes with High On/Off Current Ratio
  Published in: Silicon Carbide and Related Materials 2001 (p1145)
• A Chemical Sensor Based on AlGaN
  Published in: Functional Materials and Devices (p33)
• A UHV Study of Ni/SiC Schottky Barrier and Ohmic Contact Formation
  Published in: Silicon Carbide and Related Materials - 1999 (p1025)
• Ambipolar Transport Behaviors in Fullerene Peapod Transistors
  Published in: Nanoscience and Technology (p521)
• Application of Dielectric Spectroscopy in ZnO Varistor Ceramics
  Published in: Biotechnology, Chemical and Materials Engineering (p24)
• Ballistic Electron Emission Microscopy Study of p-Type 4H-SiC
  Published in: Silicon Carbide and Related Materials 2003 (p1077)
• Chemical Diffusion Across Grain Boundaries: In-Situ Observation and Phenomenological Modeling
  Published in: Diffusion in Materials DIMAT2000 (p1001)
• Development of Sol-Gel MgO Thin Films for SiC Insulation Applications
  Published in: Silicon Carbide and Related Materials 2003 (p1373)
• DLC-Film Schottky Barrier Diodes
  Published in: PIM & ASIP 2004 (p75)
• Effect of the Schottky Barrier Height on the Detection of Midgap Levels in 4H-SiC by Deep Level Transient Spectroscopy
  Published in: Silicon Carbide and Related Materials 2007 (p417)
• Electrical Degradation Caused by Electro-Static Discharge Pulse in ZnO-Based Multilayer Varistor
  Published in: Electroceramics in Japan XI (p15)
• Electronic Structure of Graphite/6H-SiC Interfaces
  Published in: Silicon Carbide and Related Materials 2006 (p701)
• EPD of Reverse Micelle Pd and Pt Nanoparticles onto InP and GaN for High-Response Hydrogen Sensors
  Published in: Electrophoretic Deposition: Fundamentals and Applications IV (p169)
• Extraction of the Schottky Barrier Height for Ti/Al Contacts on 4H-SiC from I-V and C-V Measurements
  Published in: Silicon Carbide and Related Materials 2003 (p993)