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CONFERENCE
6/16/2013 - 6/19/2013
The 7th International conference on Physical and Numerical Simulation of Materials Processing
5/16/2013 - 5/19/2013
2nd International Congress on Advanced Materials
4/13/2013 - 4/14/2013
2013 2nd lnternational Conference on lntclligent Materials, Applied Mechanics and Design Science (IMAMD 2013)
more...
Articles by keyword: «
Schottky Contact
»
26 papers on 2 pages:
1
[2]
[next]
A Study of Inhomogeneous Schottky Diodes on n-Type 4H-SiC
Published in:
Silicon Carbide and Related Materials 2005
(p911)
An Analytical Model for Rectifying Contacts on Polycrystalline Semiconductors
Published in:
Polycrystalline Semiconductors V
(p553)
Characteristics of Ni Schottky Contacts on Compensated 4H-SiC Layers
Published in:
Silicon Carbide and Related Materials - 2002
(p709)
Characterization of Au Schottky Contacts on p-Type 3C-SiC Gown by Low Pressure Chemical Vapor Deposition
Published in:
Silicon Carbide and Related Materials - 1999
(p1239)
Characterization of Schottky Contact on p-type 6H-SiC
Published in:
Silicon Carbide and Related Materials - 1999
(p1227)
Demonstration of Defect-Induced Limitations on the Properties of Au/3C-SiC Schottky Barrier Diodes
Published in:
Gettering and Defect Engineering in Semiconductor Technology XIII
(p331)
Effect of Source and Drain Contacts Schottky Barrier on 3C-SiC Nanowire FETs I-V Characteristics
Published in:
Silicon Carbide and Related Materials 2008
(p235)
Effect of Temperature Treatment on Au/Pd Schottky Contacts to 4H-SiC
Published in:
Silicon Carbide and Related Materials 2001
(p929)
Electrical Activity of Structural Defects in 3C-SiC
Published in:
Silicon Carbide and Related Materials 2010
(p273)
Electrical Properties of Inhomogeneous Pt/GaN Schottky Barrier
Published in:
Silicon Carbide and Related Materials 2007
(p1341)
Electrical Properties of Ni/GaN Schottky Contacts on High-Temperature Annealed GaN Surfaces
Published in:
Silicon Carbide and Related Materials 2008
(p959)
Formation of Large Area Al Contacts on 6H- and 4H-SiC Substrates
Published in:
Silicon Carbide and Related Materials 2000
(p603)
Forward Bias Capacitance-Voltage Measurements on Semiconductors Using Co-Planar Ohmic and Schottky Contacts in a Cylindrical Geometry
Published in:
Journal of Nano Research Vol. 12
(p45)
High Voltage Schottky Barrier Diodes on P-Type 4H and 6H-SiC
Published in:
Silicon Carbide, III-Nitrides and Related Materials
(p933)
Improvement of Schottky Contact Characteristics by Anodic Oxidation of 4H-SiC
Published in:
Silicon Carbide and Related Materials 2010
(p461)
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