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Papers by Keyword: Secondary Ion Mass Spectroscopy (SIMS) Analysis

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Indications for Nitrogen-Assisted Removal of Carbon from SiO₂-SiC Interface

Authors: Philippe Jamet, Sima Dimitrijev, P. Tanner

655

Improvements in Localized Corrosion Resistance of Nitrogen Ion Implanted Type 316L Stainless Steel Orthopaedic Implant Devices

Authors: K.M. Veerabadran, U. Kamachi Mudali, K.G.M. Nair, M. Subbaiyan

561