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Articles by keyword: «Silicon-on-Insulator (SOI)»

• 2x2 Optical Switch Based on Silicon-on-Insulator Microring Resonator
  Published in: Applied Materials and Electronics Engineering (p531)
• A Novel Refrigerator Device Using Single-Electron Pump Applicable to SOI Wafers
  Published in: Global Research and Education (p66)
• Active SOI Optical Ring Resonator Based on Free Carrier Injection
  Published in: MEMS, NANO and Smart Systems (p758)
• Carrier Accumulation in Silicon-On-Insulator Structures Containing Ge Nanocrystals in the Burried SiO₂ Layer
  Published in: Gettering and Defect Engineering in Semiconductor Technology XI (p77)
• Characterization of Interfacial States at Silicon Bicrystals
  Published in: Gettering anf Defect Engineering in Semiconductor Technology IX (p801)
• Crystallization of InSb Phase Near the Bonding Interface of Silicon-on-Insulator Structure
  Published in: Gettering and Defect Engineering in Semiconductor Technology XII (p137)
• Effects of High–Energy Neutrons on Advanced SOI MOSFETs
  Published in: Nanoscaled Semiconductor-on-Insulator Materials, Sensors and Devices (p95)
• Electrical and Optical Characterization of Thin Semiconductor Layers for Advanced ULSI Devices
  Published in: Gettering and Defect Engineering in Semiconductor Technology XI (p539)
• Electrical Characteristics of MOSFETs Using 3C-SiC with Buried Insulating Layer
  Published in: Silicon Carbide and Related Materials 2009 (p1009)
• Gettering of Oxygen onto Buried Defect Layer in Hydrogen Implanted Silicon Wafers after Low Temperature Surface Saturation by Oxygen and Vacuum Annealing
  Published in: Gettering and Defect Engineering in Semiconductor Technology X (p571)
• High-Efficiency SOI Photodetector Utilizing Surface Plasmon Resonance in Gold Corrugated Structure
  Published in: Global Research and Education (p154)
• Hydrogen-Related Phenomena in SOI Fabricated by Using H⁺-Ion Implantation
  Published in: Gettering anf Defect Engineering in Semiconductor Technology IX (p491)
• Incoming Inspection of Silicon-on-Insulator Substrates Using Spectroscopic and Single Wavelength Ellipsometry
  Published in: Engineered Materials (p353)
• Influence of Impurity Band on Seebeck Coefficient in Heavily-Doped Si
  Published in: Global Research and Education (p197)
• Internal Dissolution of Buried Oxide in SOI Wafers
  Published in: Gettering and Defect Engineering in Semiconductor Technology XII (p113)