Papers by Keyword: Similarity Measurements

Abstract: In order to make effective reuse of existing integrated circuit (IC) process cases, improve design efficiency, robustness of design resolutions and overcome knowledge famine and knowledge orientation problems in design process, a feature based hierarchical framework of knowledge modeling and similarity measurements based knowledge clustering method of IC process cases are proposed. In this paper, IC process cases knowledge is represented into four types: sequential type, textual type, crisp type and interval type. According to knowledge classification, sequential similarity measurement for process sequence knowledge and content similarity measurement for the rest types are listed. Finally, existing IC wafer handling process cases of an IC manufacturing enterprise are employed to verify the proposed methods.

Abstract: Image retrieval has been one of the most interesting and vivid research areas in the field of computer vision over the last decades. Content-Based Image Retrieval (CBIR) systems are used in order to automatically index, search, retrieve, and browse image databases. There are various features which can be extracted from the image which gives different performance in retrieving the image.al systems. In this paper we have tried to compare the effect of using different features on the same data base to implement CBIR system. We have tried to analyse the retrieval performance for each feature. We have compared different features as well as the combinations of them to improve the performance. We have also compared the effect of different matching techniques on the retrieval process.