Papers by Keyword: Sn-Ag-Cu

Abstract: This study discussed the effect of blast exposure distance of lead-free solder on micromechanical properties. Sn-Ag-Cu solder samples were exposed to 1000 g of Plastic Explosive. The soldered samples were placed at a distance of 1 m, 2 m and 4 m distance from the blast source. In order to study micromechanical properties in localized and more details, the nanoindentation approach was used. The indentation was performed at the center of the solder to examine the hardness and reduced modulus properties. The load-depth curve of indentation for 1 m distance from the blast source has apparent the discontinuity during loading as compared to the control sample. The hardness value increased as the distance from the blast source increased. The shortest distance from the blast source gives a high impact on the degradation of hardness properties as compared to others. This result is important in assessing the effect of exposure distance from the blast source.

Abstract: Tin-Silver-Copper (SnAgCu) lead-free solder on Electroless Nickel Immersion Gold (ENiG) and Immersion Tin (ImSn) surface finish printed circuit board was subjected to blast test. A variation of intermetallic compounds (IMC) layer, hardness and reduced modulus of soldered sample exposed to blast test were intensively investigated using optical microscope and nanoindentation machine. Formation of IMCs due to reaction between solder and substrate during blast test provided deleterious effect of metallurgical bond strength and reliability on the solder joint. Microstructural analysis was evaluated via Infinite Focused Microscope (IFM). The findings of these studies indicate that best surface finished for blast test performance was not necessarily the best surface finish for optimum reliability. ENiG and ImSn surface finish can be advantage or a disadvantage depending on the application, package and reliability requirements. As a result, most component assemblers are using ENiG and ImSn in order to improve solderability as well as the wettability between solder and the substrate and to meet various package requirements.

Abstract: In this work, B (boron) was added into Sn-1.0Ag-0.5Cu (SAC105) solder alloy using mechanical alloying method in order to develop a new low-silver lead-free solder, Sn-1.0Ag-0.5Cu-xB, where B ranges from 0wt% to 0.2wt%. The melting characteristics, wettability, mechanical properties of welded joints, and microstructure of this solder were studied. The results showed that with adding B into SAC105 alloy, the melting point and melting range was not obviously changed. Although the wettability decreases with the B content increasing, the solder joints exhibited higher shear strength. As a result, the shear strength was the highest at the B content of 0.2wt%. For example, the shear strength of the Sn-1.0Ag-0.5Cu-0.2B solder was 35.12MPa, while that of the B free SAC105 solder was only 28.94MPa. Furthermore, adding B had a significant effect on grain refinement on the SAC105 solder . Observations on solder matrix and weld joints by SEM showed that the IMC thickness of solder joints with the addition of B was less than the SAC105 lead-free solder. Moreover, with the addition of B, the solder grains were refined obviously which had the effect of refining straitening, and the growing rate of brittle IMC in solder joint could be effectively reduced during soldering and aging process. Thus solder joint performance can be improved significantly.

Abstract: Wettability for lead free solder 99.0Sn-0.3Ag-0.7Cu (SAC237) with addition of different weight percentage carbon nanotube after thermal treatment was investigated. SAC 237 solder powder with flux was mixed with 0.01%, 0.02%, 0.03% and 0.04% carbon nanotubes (CNTs) to form SAC-CNTs solder paste. Printed solder paste on test board with Cu surface finish was then reflow under 270°C temperature and isothermal aging at 150°C for 0,200 and 400 hours. Wettability of SAC-CNT solder was determined by measuring contact angle using optical microscope and image analyzer. As a result, from reflow process right through 400 hours of thermal aging, SAC237 with 0.04% CNT has the lowest contact angle as compared to other SAC-CNTs and SAC237 solder. As a conclusion, addition of carbon nanotubes into solder SAC237 improved their wettability on Cu substrate, especially at 0.04% of CNTs.

Abstract: The effect of substrate surface roughness on the wettability of SAC237 (Sn 99.9%, Ag 0.3%, Cu 0.7%) with difference percentage of CNT on copper substrate was investigated. Solder paste of SAC 237 without CNT, 0.01% and 0.04% of CNT were reflowed at 270°C on different surface roughness of Cu substrate (abrasive number 240, 400, 600, 800). Contact angle of soldered samples measured by Infinite Focus Microscope (IFM). As a result, contact angle value of investigated solders range 7° to 20°. Contact angle obtained decreases with the increasing surface roughness of Cu substrate. This demonstrates that rougher substrate enhance the wettability of the solders. Addition of CNT also effects the wettability of investigated solders. Higher composition of CNT show better wettability.

Abstract: Due to environmental concerns, lead-free solders were introduced to replace the lead-based solders in microelectronics devices technology. Although there are many lead-free solders available, the Sn-Ag-Cu solders are considered the best replacement due to their good wettability and joint strength. Although the Sn-Ag-Cu solders are accepted widely, but there are still some room for improvement. In this study, 1wt% Zn, which can be considered high percentage for a dopant, was added into the solder via powder metallurgy route. The effects of adding this dopant into the Sn-3.5Ag-1.0Cu solder on the interface intermetallic and thickness were investigated. The intermetallics phases formed were observed under Scanning Electron Microscope (SEM) and their thicknesses were measured. The SEM results showed the presence of Cu₆Sn₅, Cu₃Sn and (Cu,Zn)₆Sn₅ intermetallics. It can be concluded that Zn behaved as retarding agent and significantly retarded the growth of Cu-Sn intermetallics.

Abstract: The effect of Ag content on the morphology of the intermetallic compound (IMC) layer at the interface between Sn-xAg-0.7Cu (x=0.0 wt.%, 0.3 wt.%, 0.8 wt.%, 3.0 wt.%) and Cu substrate has been investigated. After reflow, the slight addition of Ag element can suppress the growth of IMC. However, as the Ag content increases, the thickness of IMC is enhanced. After aging at 150°C, the IMC growth rate constant decreases with the addition of Ag. The IMC growth rate constant of Sn-3.0Ag-0.7Cu is 0.94864×10^-5 μm²/s, which is the lowest among these solders. As the Ag addition is 0.8wt% and 3.0wt%, the Cu₃Sn growth rate constant is 0.16641×10^-5 μm²/s and 0.18496×10^-5μm²/s, compared to the Sn-0.7Cu solder decreased 54% and 49%, respectively. As a result, the addition of Ag element improves the anti-aging properties and suppresses the growth of Cu₃Sn layer, which leads to the improvement of solder joint reliability.

Abstract: The bulk microstructure, melting behavior, mechanical property, and interfacial Intermetallic compound (IMC) morphology were investigated on Sn-Ag-Cu (SAC) lead free solders with different Ag content (0.3,1.0,2.0,3.0,3.8wt%). The result indicates that SAC solders with higher Ag content present finer and denser intermetallic particles in the bulk solder, as a result that the tensile strength of SAC solders increased with the increasing of Ag content, while the ductility decreased. The melting temperature of SAC305 and SAC387 solders are close to eutectic point from the narrow melting range. It was found that the interfacial IMC morphology didnt appear obvious difference regardless of Ag content for as-soldered. Furthermore, the higher Ag contained solders present smaller IMC grain at the interface of aged joints and all aged joints have a tendency of polyhedron morphology.

Abstract: The toxicity in the Sn-Pb solder has promoted the development of Pb-free solder in the electronics industries. Among the Pb-solders, the Sn-3.5Ag-1.0Cu solder is considered a potential replacement and being studied by many researchers. In the present study, the characteristics of Sn-3.5Ag-1.0Cu lead-free solder were studied. The raw materials were tin, silver and copper powders in micron size. The solder was prepared using powder metallurgy route which includes blending, compacting and sintering. Four blending times and two compacting pressures were used to investigate for optimum condition. The melting temperature of the samples were studied using differential scanning calorimeter (DSC) and the presence of Sn Ag, Cu were confirmed using x-ray diffraction analysis (XRD). Finally the effect of variables on the hardness of the solders is reported.

Abstract: The development of lead-free solders has been an essential task in the electronics industry because of the restriction of lead use by legislation. Among the candidates, Sn-Ag-Cu group of solder alloys have great advantages to replace the conventional Sn-Pb solder. In this study, the wetting and intermetallic study between Sn-3.5Ag-1.0Cu-xZn lead-free solder reacting on copper substrate were investigated under different soldering conditions. The addition of 0.7wt% of Zn improved the wettability on Cu substrate since it has the highest spreading area at 310°C. The Cu6Sn5 and Cu3Sn phases are the main interface intermetallic formed and these intermetallics increased in thickness with time and temperature. At 270°C, the addition of 0.7wt% Zn retarded the growth of Cu3Sn intermetallic until 10 min of the soldering time. Generally the addition of Zn was beneficial in retarding the total intermetallic thickness.