| Paper Title | Page |
|---|---|
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Advanced Real Time Metrology of AlGaN/GaN and InGaN/GaN Epitaxy Authors: Tong Ho Kim, Soo Jeong Choi, April S. Brown, Maria Losurdo, Giuseppe Valerio Bianco, Maria M. Giangregorio, Giovanni Bruno |
124 |
|
Authors: Y.V. Kudryavtsev, Sergey I. Sidorenko, Yu.N. Makogon, E.P. Pavlova, T.I. Verbitskaya, Y.P. Lee, Y.H. Hyun, V.A. Oksenenko |
572 |
|
Characterization of 4H-SiC–SiO2 Interfaces by a Deep Ultraviolet Spectroscopic Ellipsometer Authors: H. Seki, T. Wakabayashi, Yasuto Hijikata, Hiroyuki Yaguchi, Sadafumi Yoshida |
505 |
|
Authors: A. Szekeres, E. Vlaikova, T. Lohner, Attila Lajos Tóth, I.P. Lisovskyy, S.O. Zlobin, P.E. Shepeliavyi |
149 |
|
Characterization of the Interfaces between SiC and Oxide Films by Spectroscopic Ellipsometry Authors: Yuichi Tomioka, T. Iida, M. Midorikawa, H. Tukada, K. Yoshimoto, Yasuto Hijikata, Hiroyuki Yaguchi, Masahito Yoshikawa, Yuuki Ishida, Ryouji Kosugi, Sadafumi Yoshida |
1029 |
|
Effect of Chemical Solution on the Stability of Low-k Films Authors: Els Kesters, Quoc Toan Le, Mikhail R. Baklanov, Werner Boullart, Paul W. Mertens |
349 |
|
Effect of Redistribution of the Optical Spectral Weight in CuO Nanostructured Ceramics Authors: A.A. Makhnev, L.V. Nomerovannaya, Boris A. Gizhevskii, Sergey V. Naumov, Natalia V. Kostromitina |
285 |
|
Effect of UV-Irradiation on Anodized Films Formed on Titanium in 0.1M H2SO4 Solution Authors: Yu Hong Yao, Hiroshi Nanjo, Jiang Nan Liu, Zheng Bin Xia, Zheng Pin Wang, Jian Feng Wei |
208 |
|
Effects of Ion Bombardment upon Microcrystalline Silicon Growth Authors: Billel Kalache, R. Brenot, V. Tripathi, Satyendra Kumar, R. Vanderhaghen, Pere Roca i Cabarrocas |
71 |
|
Electronic Properties of Wet-Chemically Prepared Oxide Layers Authors: Heike Angermann, W. Henrion, M. Rebien |
181 |