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Papers by Keyword: Spectroscopic Ellipsometry (SE)

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Characterization of the Interfaces between SiC and Oxide Films by Spectroscopic Ellipsometry

Authors: Yuichi Tomioka, T. Iida, M. Midorikawa, H. Tukada, K. Yoshimoto, Yasuto Hijikata, Hiroyuki Yaguchi, Masahito Yoshikawa, Yuuki Ishida, Ryouji Kosugi, Sadafumi Yoshida

1029

The Investigation of 4H-SiC/SiO₂ Interfaces by Optical and Electrical Measurements

Authors: Yuuki Ishida, Tetsuo Takahashi, Hajime Okumura, Tamotsu Jikimoto, Hidekazu Tsuchida, Masahito Yoshikawa, Yuichi Tomioka, M. Midorikawa, Yasuto Hijikata, Sadafumi Yoshida

1013

The Structure and Photoluminescence of Erbium-Doped Nanocrystalline Silicon Thin Films Produced by Reactive Magnetron Sputtering

Authors: M.Fátima Cerqueira, Maria Losurdo, M.V. Stepikhova, Olinda Conde, M.M. Giangregorio, Pedro Pinto, João Alves Ferreira

637

Highly Crystalline Intrinsic Microcrystalline Silicon Films Using SiF₄/Ar/H₂ Glow Discharge Plasma

Authors: Satyendra Kumar, R. Brenot, Billel Kalache, V. Tripathi, R. Vanderhaghen, B. Drevillon, Pere Roca i Cabarrocas

237

Ellipsometric Study of Ion-Implantation Damage in Single-Crystal Silicon - An Advanced Optical Model

Authors: P. Petrik, O. Polgár, T. Lohner, M. Fried, N.Q. Khánh, J. Gyulai

765

Effects of Ion Bombardment upon Microcrystalline Silicon Growth

Authors: Billel Kalache, R. Brenot, V. Tripathi, Satyendra Kumar, R. Vanderhaghen, Pere Roca i Cabarrocas