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Articles by keyword: «Stacking Fault»

• ‘Switch-Back Epitaxy’ as a Novel Technique for Reducing Stacking Faults in 3C-SiC
  Published in: Silicon Carbide and Related Materials 2005 (p291)
• Ab Initio Calculation of Mechanical Properties of Stacking Fault in 3C-SiC: Effect of Stress and Doping
  Published in: Silicon Carbide and Related Materials 2011 (p415)
• 4H-SiC Epitaxial Growth on 2° Off-Axis Substrates using Trichlorosilane (TCS)
  Published in: Silicon Carbide and Related Materials 2011 (p101)
• 6H-Type Zigzag Faults in Low-Doped 4H-SiC Epitaxial Layers
  Published in: Silicon Carbide and Related Materials 2009 (p347)
• 8H Stacking Faults in a 4H-SiC Matrix: Simple Unit Cell or Double 3C Quantum Well?
  Published in: Silicon Carbide and Related Materials 2008 (p339)
• A Model for Crack-Induced Nucleation of Dislocations, Complex Stacking Faults and Twins
  Published in: Materials Structure & Micromechanics of Fracture (p17)
• Absence of Dislocation Motion in 3C-SiC pn Diodes under Forward Bias
  Published in: Silicon Carbide and Related Materials 2006 (p223)
• An Ab Initio Study of Intrinsic Stacking Faults in GaN
  Published in: Silicon Carbide and Related Materials 2003 (p1617)
• An ab initio Study of Native Defects in Cubic SiC: Vacancies and Stacking Faults
  Published in: Silicon Carbide, III-Nitrides and Related Materials (p283)
• Analysis of Structural Defects in the 4H-SiC Epilayers and their Influence on the Electrical Properties
  Published in: Silicon Carbide and Related Materials 2003 (p1085)
• Analysis of the Interfacial Relationship in GaN/(0001) AI₂O₃ Layers
  Published in: Intergranular and Interphase Boundaries in Materials (p111)
• Anisotropic Elastic Distortions of a Buried Dissociated Hexagonal Network of Dislocations in a Nickel Based Super Alloys
  Published in: Advances in Materials and Processing Technologies (p289)
• Anisotropic Line Broadening from Stacking Faults in Rietveld Refinement
  Published in: European Powder Diffraction 6 (p28)
• Annealing Effect of Cu on the Co Structure in Cu/Co/Cu Sandwiches
  Published in: Intergranular and Interphase Boundaries in Materials (p697)
• Approaches to Stabilizing the Forward Voltage of Bipolar SiC Devices
  Published in: Silicon Carbide and Related Materials 2003 (p1113)