Papers by Keyword: Standard Specimen

Abstract: Practically exact solutions of stress intensity factor for several two-dimensional standard specimens were calculated and shown in numeric tables. The solutions were confirmed to converge until 6 significant figures through a systematical computation of discretization analysis. The convergence analyses were carried out by using a general purpose program based on a body force method.

Abstract: Three blocks of silicon have been crashed in this experiment in order to verify the crashing effects on specimens having distinct original micro-structural arrangements. One of them comes from a rod bar of mono-crystal silicon, two others were from polycrystalline silicon manufactured by two distinct manufacturers with distinct growing process. Several specimens of powders, differing in type and grain size, were obtained by treating these source samples. This paper reports on data collected from synchrotron and conventional radiation and the results show that powders obtained from mono-crystalline silicon provide diffraction profiles, where the structural contribution is smaller than for polycrystalline silicon specimens. The peaks from the 'mono-crystal powder' resulted even narrower than peaks from SRM Silicon 640b by NIST.