Papers by Keyword: Strain Mapping

Abstract: The measuring of internal stress has not only a great scientific aspect, but is particularly important for nondestructive description of component or products in industry. It is expected that exceeding of local mechanical limits in the material can have catastrophic consequences. In this paper is mapped the deformation field of amorphous material under the nanoindenter tip using diffraction in Debye-Scherrer geometry. Using the FEM analysis, it was modeled the deformation field in such material. There is a great match in between measured and calculated data. The result is pointing out on large limits of internal stresses measuring by conventional standard methods.

Abstract: Strain is routinely used in state-of-the-art semiconductor devices in order to improve their electrical performance. Here we present experimental strain measurements obtained by different transmission electron microscopy (TEM) based techniques. Dark field electron holography, nanobeam electron diffraction (NBED) and high angle annular dark field scanning electron microscopy (HAADF STEM) are demonstrated. In this paper we demonstrate the spatial resolution and sensitivity of these different techniques on a simple calibration specimen where the accuracy of the measurement can easily be assessed.

Abstract: The spatial resolution of time of flight neutron transmission diffraction was recently improved by the extension of photon/electron counting technology to imaging of thermal and cold neutrons. The development of novel neutron sensitive microchannel plates enables neutron counting with spatial resolution of ~55 um and time-of-flight accuracy of ~1 us, with efficiency as high as 70% for cold and ~40% for thermal neutrons. The combination of such a high resolution detector with a pulsed collimated neuron beam provides the opportunity to obtain a 2-dimensional map of neutron transmission spectra in one measurement. The results of our neuron transmission measurements demonstrate that maps of strains integrated along the beam propagation direction can be obtained with ~100 microstrain accuracy and spatial resolution of ~100 um providing there are sufficient neutron events collected. In this paper we describe the capabilities of the MCP neutron counting detectors and present the experimental results of 2-dimensional strain maps within austenitic steel compact tension (CT) crack samples measured at the ENGIN-X beamline of the ISIS pulsed neutron source.

Abstract: Two Japanese long swords (katanas) belonging to the Koto Age (X-XVI century A.D.) were measured through time of flight neutron diffraction to analyze the phases, and the stress and strain distribution, in selected parts of the blades. The swords are representative of two different forging schools (Aoe and Kanesada) and one of the main aims of the measurements was to evidence possible similarities and differences. Two independent experiments were carried out at the ISIS pulsed neutron source using the INES and ENGIN-X diffractometers. The former was employed to map the average phase distribution on two selected cross sections, of each blade, distinguishing among the ridge, the core, and the edge of the blades. In this way, we were able to quantify the coarse distribution of the carbon content and, moreover, we could evidence the presence of martensite. These data were then complemented measuring detailed stress and strain distribution maps on ENGIN-X. As far as the ridge and the core are concerned, the tang data were taken as a reference. These measurements significantly improve the knowledge and understanding of the technology used to produce Japanese swords belonging to the Koto Age.

Abstract: A simplified method to determine the strain distribution during incremental forming of a cone is proposed in this paper. Because of the symmetry of the deformed part, the strain can be derived using the results obtained from a limited number of consecutive tool contours instead of going through the whole process. Comparisons made between the measured and simulated results show that the proposed method can be applied to determine the strain encountered in such kind of incremental forming process where axi-symmetric parts are formed.

Abstract: The geometric phase technique (GPA) for measuring the distortion of crystalline lattices from high-resolution electron microscopy (HRTEM) images will be described. The method is based on the calculation of the “local” Fourier components of the HRTEM image by filtering in Fourier space. The method will be illustrated with a study of an edge dislocation in silicon where displacements have been measured to an accuracy of 3 pm at nanometre resolution as compared with anisotropic elastic theory calculations. The different components of the strain tensor will be mapped out in the vicinity of the dislocation core and compared with theory. The accuracy is of the order of 0.5% for strain and 0.1° for rigid-body rotations. Using bulk elastic constants for silicon, the stress field is determined to 0.5 GPa at nanometre spatial resolution. Accuracy and the spatial resolution of the technique will be discussed.