Articles by keyword: «Synchrotron X-Ray Topography»
4 papers on 1 page:
1
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Characterization of Triangular-Defects in 4° off 4H-SiC Epitaxial Wafers by Synchrotron X-Ray Topography and by Transmission Electron Microscopy
Published in: Silicon Carbide and Related Materials 2011 (p363) -
Conversion Mechanism of Threading Screw Dislocation during SiC Solution Growth
Published in: Silicon Carbide and Related Materials 2011 (p351) -
Reduction of Dislocations in the Bulk Growth of SiC Crystals
Published in: Silicon Carbide and Related Materials 2005 (p3) -
The Effect of In Situ Surface Treatment on the Growth of 3C-SiC Thin Films on 6H-SiC Substrate - An X-ray Triple Crystal Diffractometry and Synchrotron X-ray Topography Study
Published in: Silicon Carbide and Related Materials - 1999 (p1045)