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Articles by keyword: «TEM»

• Transmission Electron Microscopy Observations on the Precipitates in Al-Zn-Mg Based Sacrificial Anode Alloy
  Published in: Physical and Numerical Simulation of Material Processing VI (p989)
• Transmission Electron Microscopy of Isothermally Oxidized EB-PVD Thermal Barrier Coating on (Ni,Pt)Al Bondcoat
  Published in: Eco-Materials Processing & Design VI (p149)
• Transmission Electron Microscopy of LatticeDefects in CZ-Silicon Wafer Formed by Two-Stage Annealing
  Published in: Defects in Semiconductors 18 (p1823)
• Transmission Electron Microscopy of Metastable Materials
  Published in: Nonequilibrium Materials (p181)
• Transmission Electron Microscopy of the Configuration of Cracks and the Defect Structure near to Cracks in Si
  Published in: Defects and Diffusion in Semiconductors IV (p225)
• Transmission Electron Microscopy Studies of Lattice-Mismatched Semiconductor Heterostructures Used for Integrated Optoelectronic Devices
  Published in: Polycrystalline Semiconductors IV (p131)
• Transmission Electron Microscopy Studies of Mechanical Alloying in the Immiscible Fe₂O₃-SnO₂ System
  Published in: Mechanically Alloyed, Metastable and Nanocrystalline Materials (p351)
• Transmission Electron Microscopy Studies of Oxidation of Single Crystal Silicon Carbide at High Temperature
  Published in: PRICM 6 (p2135)
• Transmission Electron Microscopy Studies of X210CrW12 and 100CR6 Thixo-Cast Steels
  Published in: Electron Microscopy XIV (p311)
• Transmission Electron Microscopy Study of GaN on SiC on SIMOX Grown by Metalorganic Chemical Vapor Deposition
  Published in: Silicon Carbide, III-Nitrides and Related Materials (p1239)
• Transmission Electron Microscopy Study of Microstructural Evolution in Nanograined Ni-Ti Microwires Heat Treated by Electric Pulse
  Published in: Solid-Solid Phase Transformations in Inorganic Materials (p682)
• Transmission Electron Microscopy Study of the Microstructure of a GaN Film Grown on Sapphire by Organometallic Vapor Phase Expitaxy
  Published in: Defect and Diffusion Forum Vols. 148-149 (p122)
• Transmission Electron Microscopy Study of Thermal Barrier Coatings Fabricated by Electron Beam-Physical Vapor Deposition
  Published in: PRICM-5 (p2877)
• Transmission Electron Microscopy Study of Ti-Doping Effect on Alumina Sintering Behaviour
  Published in: Euro Ceramics VII (p1523)
• Triangular Dislocation Loop Model for Surface Displacement in Indented Thin Films
  Published in: PRICM7 (p1768)