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CONFERENCE
6/16/2013 - 6/19/2013
The 7th International conference on Physical and Numerical Simulation of Materials Processing
5/16/2013 - 5/19/2013
2nd International Congress on Advanced Materials
4/13/2013 - 4/14/2013
2013 2nd lnternational Conference on lntclligent Materials, Applied Mechanics and Design Science (IMAMD 2013)
more...
Articles by keyword: «
Thermal Donor
»
44 papers on 3 pages:
1
[2]
[3]
[next]
"New Donors" in Czochralski Grown Silicon Annealed at T≥ 600°C under Compressive Stress
Published in:
Gettering and Defect Engineering in Semiconductor Technology XI
(p181)
About the Electrical Properties of Oxygen Phases Segregated by Annealing Cz Silicon in the 600-800°C Range
Published in:
Gettering and Defect Engineering in Semiconductor Technology VIII
(p327)
An Investigation of the Possibility that Oxygen Diffusion in Czochralski Silicon is Catalyzed during Clustering
Published in:
Defects in Semiconductors 19
(p347)
Anomalous Fast Annihilation of Thermal Donors in Carbon-Rich Silicon
Published in:
Defects in Semiconductors 18
(p1321)
Defects and Diffusion: First- Principles Modeling
Published in:
Diffusion in Materials DIMAT2000
(p261)
Diffusion and Precipitation of Oxygen in Silicon Doped with Germanium
Published in:
Defects in Semiconductors 19
(p1767)
Diffusion and Precipitation of Oxygen in Silicon Doped with Germanium
Published in:
Gettering and Defect Engineering in Semiconductor Technology VII
(p183)
DLTS Study on Deep Levels Formed in Plasma Hydrogenated and Subsequently Annealed Silicon
Published in:
Gettering and Defect Engineering in Semiconductor Technology XI
(p547)
Effect of Annealing Temperature on the Properties of Silicon Crystal
Published in:
Advanced Materials
(p1323)
Effect of Electron Irradiation on Thermal Donors in Oxygen-Doped High-Resistivity FZ Si
Published in:
Gettering and Defect Engineering in Semiconductor Technology X
(p53)
Effect of Stress Induced Defects on Electrical Properties of Czochralski Grown Silicon
Published in:
Gettering and Defect Engineering in Semiconductor Technology VII
(p393)
Electrical Detection of Electron Paramagnetic Resonance: Studies of the Mechanism of the Spin-Dependent Recombination Process
Published in:
Defects in Semiconductors 18
(p1509)
Electronic States of Thermal Donors in Semiconductors
Published in:
Shallow Impurities in Semiconductors V
(p9)
Endor Identification of a Hydrogen-Passivated Thermal Donor
Published in:
Defects in Semiconductors 18
(p849)
Enhanced Formation of Thermal Donors in Germanium Doped Czochralski Silicon Pretreated by Rapid Thermal Annealing
Published in:
Gettering and Defect Engineering in Semiconductor Technology XII
(p393)
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