Papers by Keyword: Thickness Determination

Abstract: This paper deals with the determination of selected parameters (the thickness and the dynamic modulus of elasticity) of concrete structures by non-destructive methods. Short overview of the literature, the description of used methods, measuring devices used during the tests, the descriptions of examined structures, and obtained results are mentioned. Two independent methods (the Ultrasonic Method and the Resonant Method, in some case with the combination of the Phase Velocity Method), had been used for determination of required parameters of structures. The results had been in good coincidence with the values mentioned in the literature. At the end of the paper, obtained results are summarized and future plans are presented.

Abstract: Coating is an application of a surface finish to another material and it provides the surfaces of manufactured parts with a number of desirable physical, chemical, and appearance qualities. Nearly all manufactured or fabricated products made of metal or having metal components have some types of surface coating. The coating increases sturdiness, prevents corrosion, provides hardness, or gives an attractive finish to an object. The amount of coating applied to a material, that is, the coating thickness, is crucial to the product’s final use and cost. On the other hand, in the case of surfaces subjected to wear, the same thickness is very important in the life of the product. There are several non-destructive methods of measuring coating thickness. The aim of this paper is the development and validation of an impulse excitation technique and laser measurements to determine coating thickness of metallic or nonmetallic surface.

Abstract: The thickness measurement based on absorption of X-rays in thin films has been tested on a polycrystalline titanium nitride films deposited on a tungsten carbide substrate. Intensities of three reflections from each material were measured for incidence angles of the primary beam ranging from 0.5° to 35°. After experimental correction for texture effects, data from the TiN film and the WC substrate were fitted by known functions using least squares routines. The substrate reflection intensities were found to be more suitable for determining the thickness of the overlaying thin film. The average thickness of TiN film (2.00± 0.17 µm) determined from the substrate reflections was in fair agreement with the average value obtained from optical microscopy (2.2± 0.8 µm). The thickness values determined from the TiN thin film reflections are very unreliable due to a high sensitivity of measurements to disturbing instrumental and sample effects at small angles.