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Articles by keyword: «Thin Film»

• All-Optical Material Charaterization Method by the Application of Bistability in Luminescence
  Published in: II-VI Compounds and Semimagnetic Semiconductors (p291)
• All-Optical Poling Properties of the Host-Guest Adulterant Thin-Films
  Published in: High Performance Structures and Materials Engineering (p549)
• Aluminum-Doped Zinc Oxide as Transparent Electrode Materials
  Published in: Energy, Environment and Biological Materials (p6)
• Amorphous and Crystalline States in Thin Films of N₂O
  Published in: Trends and New Applications of Thin Films (p419)
• Amorphous-Crystalline Microstructures of Heat-Treated, Melt-Spun Ti₅₀Ni₂₅Cu₂₅ Ribbons
  Published in: Shape Memory Materials (p131)
• An Analysis of the Influence of Crystallographic Texture on Residual Stress Estimation for Metallic Films and Coatings
  Published in: European Powder Diffraction 4 (p311)
• An Electrical Method for Measuring Fatigue and Tensile Properties of Thin Films on Substrates
  Published in: The Mechanical Behavior of Materials X (p1115)
• An Experimental Method for Micro-Scale Uniaxial Tension Test
  Published in: Experimental Mechanics in Nano and Biotechnology (p233)
• Analysis and Calculation of Vacuum Film Deaeration for High Viscosity Liquids
  Published in: Functional Manufacturing and Mechanical Dynamics II (p76)
• Analysis of Cracking and Delamination of Sputtered Thin Films during Wear Process
  Published in: Advances in Fracture and Strength (p1718)
• Analysis of Formation Process of Ferroelectric Domain Structure in PZT Thin Films by In-Situ TEM
  Published in: Asian Ceramic Science for Electronics II and Electroceramics in Japan V (p203)
• Analysis of Nonlinear Dielectric Characteristics of (Ba, Sr)TiO₃ Thin Films and their Frequency Conversion Application
  Published in: Electroceramics in Japan XI (p183)
• Analysis of Residual Stress Gradients in Thin Films Using SEEMANN-BOHLIN-X-Ray Diffraction
  Published in: European Powder Diffraction 4 (p301)
• Analysis of Residual Stress-Texture Relationships in Thin Films
  Published in: THERMEC 2009 Supplement (p425)
• Analysis of SiO₂ Thin Film Deposited by Reactive Sputtering
  Published in: Recent Developments in Advanced Materials and Processes (p149)