Papers by Keyword: Ti3SiC2

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Abstract: P-type Ti/Al-based contact vias of different sizes but identical processing were electrically characterized using linear transfer length method (TLM) patterns and metal-oxide-semiconductor (MOS) transistors. While the TLM patterns and MOS transistors with large vias follow ohmic contact behavior, Schottky contact properties were observed for smaller contact via dimensions. Focused ion beam (FIB) analysis of the contact vias verified the presence of Ti3SiC2 on large 66 μm x 25 μm contact vias and its absence on smaller 16 μm x 3 μm ones, correlating its absence with the electrical Schottky properties.
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Abstract: The Ti3SiC2-TiB2-TiC three-phase ceramics are prepared by Spark Plasma Sintering (SPS) method with Self-propagating High-temperature Synthesis (SHS) using Ti, Si, C andB4C powders. The characterization of sintering product’s image and structure is analyzed by XRD and SEM. Most of TiB2’s images are angular cuboid or short bar-shaped and most of TiC phase’s images are irregular spherical particles which are evenly embedded in Ti3SiC2 substrate and have a good combination interface with Ti3SiC2. In the composite ceramic SPS sintering process, sinter sample’s displacement along Z-axis goes through three stages of falling, balance and rising along with the change of heating temperature, which reflects the sample’s change rule between heated expansion force and pressure. Finally its machining performance is analyzed by wire cutting method and machining method. The Ti3SiC2-TiC-TiB2 block composite ceramic proves to have a good machining performance.
426
Abstract: TLM structures on Al-implanted regions with different implanted Al concentrations and different annealing temperatures were processed and characterized by electrical measurements in order to determine the influence of these parameters on the ohmic resistivity. Based on these results, a TCAD model was developed that considers the carrier concentration of the implanted region, the effective density of states for holes and the hole tunneling mass at the Ti3SiC2-SiC interface. It could be shown that Ti3SiC2 allows to form ohmic contacts on Al implanted samples with an effective doping concentration down to 3·1017 cm-3. Furthermore the effective density of states for holes in Ti3SiC2 was determined to 8.5·1018 cm-3 and the hole tunneling mass in SiC and Ti3SiC2 in the range of 2·10-34 kg to 6·10-33 kg depending on the sample.
393
Abstract: Titanium silicon carbide (Ti3SiC2) were obtained by molten salt synthesis method using the Ti-Si-Fe alloy extracted from high titania blast furnace slag and natural graphite as the raw materials. The phase composition, microscopic structure of the products were characterized by powder X-ray diffraction, scanning electron microscope and transmission electron microscope. The influence of firing temperature and chloride salts species on the phase and morphology of the products were investigated. The results indicated that the synthetic temperature of Ti3SiC2 by molten salt synthesis method was about 100 °C, which was lower than that without molten salts. The “dissolution-precipitation” mechanism governed the overall molten salt synthesis process. The lamellar Ti3(Si,Al)C2 crystal growth obeyed by a two-dimensional ledge growth mechanism.
159
Abstract: Free Ti/Si/C powder mixtures with or without molten salt were heated under vacuum with various schedules. The effect of molten salt during synthesis on the morphology and phase composition of Ti3SiC2 powders were investigated. The combustion powders were analyzed by DSC, XRD, SEM and EDS. The results indicated that the existence of molten salt could promote the reaction process and decrease the synthesis temperature. The Ti3SiC2 powders obtained by molten salt method were uniform and well dispersive. The content of Ti3SiC2 phase was influenced by salt/powders ratio and molding pressure. The appropriate salt/powders ratio and pre-press pressure were 1:1and 100 MPa, respectively.
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Abstract: Ti3SiC2 and three different kinds of Ti3SiC2 matrix composites (Ti3SiC2/SiC, Ti3SiC2/Al2O3 and Ti3SiC2/MgAl2O4) were fabricated by reactive hot pressing method. The oxidation resistance of four kinds of materials at 1373 K-1773 K was investigated by X-ray diffraction (XRD) and scanning electron microscope (SEM). The results showed that the main oxidation products of Ti3SiC2 were rutile and cristobalite. The oxidation layers were composed of two layers, the outer was consisted of TiO2, and the inner was a two-phase mixture of TiO2 and SiO2. A large number of pores existed in oxide layers which leading to a poor oxidation resistance. For Ti3SiC2 matrix composites, rutile grains in oxidation layers were refined due to the introduction of the second phase. The volume expansion caused by reactions between Al2O3 (or MgAl2O4) and TiO2 could close pores and improve the densification of oxide layers, which further improve the oxidation resistance of Ti3SiC2/Al2O3 and Ti3SiC2/MgAl2O4. As for the oxidation of Ti3SiC2/SiC, the SiO2 content in oxidation layers was increased from the oxidation of SiC. The dense SiO2 layer acted as a protective film which could prevent the inward diffusion of oxygen. Moreover, liquid phase under high temperature could also fill the pores in oxidation layers. Thus, Ti3SiC2/SiC composite had the best oxidation resistance among three Ti3SiC2 matrix composites.
558
Abstract: In this study, the electrical properties of Ti3SiC2 based ohmic contacts formed on p-type 4H-SiC(0001) 4°-off substrates were studied. The Ti3SiC2 thin films were grown by thermal annealing (from 900°C to 1200°C) of Ti50Al50 layer deposited by magnetron sputtering. XRD analyzes were performed on the samples to further investigate the compounds formed after annealing. Using TLM structures, the Specific Contact Resistance (SCR) at room temperature of all contacts was measured. The temperature dependence (up to 600°C) of the SCR was studied to understand the current mechanisms at the interface and to determine the barrier height value by fitting the experimental results using the thermionic field emission theory. Aging tests showed that Ti3SiC2 based contacts were stable up to 200h at 600°C under Ar.
553
Abstract: Layered ternary compounds Ti3SiC2 combines attractive properties of both ceramics and metals, and has been suggested for potential engineering applications. Near-fully dense Ti3SiC2 bulks were sintered from commercial Ti3SiC2 powders by hot press at 1350°C-1600°C for 60-120min under Ar atmosphere in this paper. The phase compositions and morphology of the as-prepared samples were evaluated by X-Ray diffraction (XRD) and scanning electron microscopy (SEM). And the mechanical properties were measured by Three-Point bending method. It was found that the Ti3SiC2 had only a little of decomposition at sintering temperature above 1350°C. And effects of sintering temperature and holding time on the morphology of the bulk Ti3SiC2 are not obvious. Relative density of 98% and flexural strength of 480MPa were obtained for the Ti3SiC2 samples sintered at 30MPa and 1400°C for 90min.
68
Abstract: In order to form Ti3SiC2 on 4H-SiC(0001) 8°-off, 200 nm of Ti30Al70 was deposited onto SiC substrates by magnetron sputtering from pure Ti30Al70 targets. The samples were then annealed at 1000°C for 10 min under Ar atmosphere in a Rapid Thermal Annealing (RTA) furnace. Structural analyses reveal the formation of epitaxial hexagonal Ti3SiC2 (0001) oriented. Elemental analyses show that high amount of Al and O elements are present inside the deposit. Obviously, the formation of Ti3SiC2 is accompanied by parasitic Al oxide, probably due to some unwanted oxygen residual in the RTA chamber. By using proper backing steps before the annealing, the deposit is not anymore composed of only Ti3SiC2 but accompanied with other compounds (Al3Ti, and Al). On the oxide-free sample, the specific contact resistance ρc of the Ti3SiC2 based contact on p-type 4H-SiC (having Na= 2×1019 cm-3) was measured to be as low as 6×10-5 Ω.cm2.
432
Abstract: Ti/Si/C element powders were used to synthesize Ti3SiC2 by spark plasma sintering. The synthesized products consisted of Ti3SiC2, together with TiC and Ti5Si3 as impurities. The addition of Al, excess Si, and appropriate sintering temperature increased the purity of Ti3SiC2 in the products. From the 3Ti/1.2Si/2C/0.2Al mixture, Ti3SiC2 with the purity 99 mass % was synthesized at 1300 °C for 5 min at 30 MPa.
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