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Articles by keyword: «Vanadium»

• A New Soft Chemistry Synthesized Vanadium Oxysulfide
  Published in: Soft Chemistry Routes to New Materials (p319)
• A Novel Method of Leaching Vanadium from Extracted Vanadium Residue Using Sodium Sub-Molten Salt Medium
  Published in: Advances in Metallurgical and Mining Engineering (p253)
• A Simple Model of 3d Impurities in Cubic Silicon Carbide
  Published in: Silicon Carbide and Related Materials - 2002 (p515)
• Acid Leaching of Vanadium from a Vanadium Residue
  Published in: Advances in Metallurgical and Mining Engineering (p243)
• Alloy Constitution Dependence of Strength and Deformation in Aluminum-Titanium-Vanadium Ternary Alloys Containing Gamma+Beta Dual Phase Microstructures
  Published in: THERMEC 2009 (p350)
• Band Gap States of Cr in the Lower Part of the SiC Band Gap
  Published in: Silicon Carbide and Related Materials 2000 (p471)
• Characterization of Deep Levels in SiC by Photoluminescence Spectroscopy and Mapping
  Published in: Silicon Carbide, III-Nitrides and Related Materials (p481)
• Characterization of Inclusions in SiC Bulk Crystals Grown by Modified Lely Method
  Published in: Silicon Carbide and Related Materials 2001 (p75)
• Charactrization of Residual Transition Metal Ions in GaN and AIN
  Published in: Defects in Semiconductors 18 (p55)
• Chemistry of Hybrid Organic-Inorganic Materials Synthesized via Sol-Gel
  Published in: Soft Chemistry Routes to New Materials (p313)
• Comparison Study of the Electrochemical Behavior of Vanadate in NaOH and KOH Solutions
  Published in: Advances in Metallurgical and Mining Engineering (p66)
• Cooling Process for Precipitation Strengthening of Vanadium in Ferrite
  Published in: THERMEC 2011 (p2078)
• Correlation between Room Temperature Photoluminescence and Resistivity in Semiinsulating Silicon Carbide
  Published in: Silicon Carbide and Related Materials 2005 (p717)
• Deep Level Point Defects in Semi-Insulating SiC
  Published in: Silicon Carbide and Related Materials 2005 (p517)
• Deep Levels of Vanadium- and Chromium-Hydrogen Complexes in Silicon
  Published in: Defects in Semiconductors 17 (p939)