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Articles by keyword: «Void»

• A Method of Detecting Voids under Concrete Plates by Impact-Echo Test
  Published in: Explosion, Shock Wave and Hypervelocity Phenomena in Materials (p349)
• A Model for Positron Trapping at Voids in Metals
  Published in: Positron Annihilation - ICPA-9 (p1293)
• A Study of Defects in SiO₂ Films on Si by Variable-Energy Positron Annihilation Spectroscopy
  Published in: Positron Annihilation - ICPA-10 (p157)
• Analysis of OSB Mat Structure Using CAD Technology
  Published in: Environment Materials and Environment Management (p1619)
• Assessment of Damage and Fracture Behaviours in a Cast Aluminium Alloy via In Situ Synchrotron Microtomography
  Published in: Aluminium Alloys 2006 - ICAA10 (p1005)
• Atomistic Simulations of Nanoindentation on Cu (111) with a Void
  Published in: Advances in Fracture and Materials Behavior (p919)
• Biaxial Tensile Deformation Behavior and Microstructural Evolutions of Superplasticity in AZ31 Magnesium Alloy
  Published in: Superplasticity in Advanced Materials - ICSAM 2006 (p225)
• Can PAC Measurements be Used to Investigate Defects in Nano-Structures?
  Published in: Defects and Diffusion Studied Using PAC Spectroscopy (p105)
• Collective Evolution Characteristics and Computer Simulation of Voids Near the Crack Tip of Ductile Metal
  Published in: Fracture and Strength of Solids IV (p157)
• Control of Void Formation in 4H-SiC Solution Growth
  Published in: Silicon Carbide and Related Materials 2011 (p57)
• Damage Behavior of Electron/Helium Dual-Beam Irradiation on Fe-Cr-Mn (W, V) Alloy
  Published in: PRICM-5 (p1463)
• Damage Evolution in Helium-Hydrogen Co-Implanted (100) Silicon
  Published in: Gettering anf Defect Engineering in Semiconductor Technology IX (p291)
• Damage Mechanisms of 5A06 Al Alloy Weld Joints under Constant Load and Thermal Cycling Condition
  Published in: THERMEC 2006 (p368)
• Defect Analyses of Deformed Zr-Cu-Ni-Al Bulk Metallic Glasses
  Published in: Diffusion in Solids and Liquids IV (p453)
• Defect Engineering in the Development of Advanced Silicon Crystals and Wafers
  Published in: Gettering and Defect Engineering in Semiconductor Technology VIII (p111)