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Articles by keyword: «X-Ray Topography»

• 4H-SiC Epitaxial Layers Grown on On-Axis Si-Face Substrate
  Published in: Silicon Carbide and Related Materials 2006 (p53)
• A Comparison of Aluminum Nitride Freely Nucleated and Seeded on 6H-Silicon Carbide
  Published in: Silicon Carbide and Related Materials - 1999 (p1599)
• A Study of Inhomogeneous Schottky Diodes on n-Type 4H-SiC
  Published in: Silicon Carbide and Related Materials 2005 (p911)
• An In-Situ Observation of Dislocations and Crystal-Melt Interface during the Melting of Silicon
  Published in: Beam Injection Assessment of Microstructures in Semiconductors (p217)
• An X-Ray Sensitive CCD Camera System and Its Application to the X-Ray Diffractometric Investigation on Area Selective Semiconductor Epitaxy
  Published in: Nondestructive Characterization of Materials VII (p219)
• An X-Ray Topographic Analysis of the Crystal Quality of Globally Available SiC Wafers
  Published in: Silicon Carbide and Related Materials 2006 (p227)
• Anisotropy of Grain Boundary Migration Observed in Situ by Synchrotron Radiation
  Published in: Recrystallization and Grain Growth (p911)
• Application of the Three-Dimensional Damage Percolation Model and X-Ray Tomography for Damage Evolution Prediction in Aluminium Alloys
  Published in: Aluminium Alloys 2006 - ICAA10 (p1011)
• Assessment of the Deformation of Low Density Polymeric Auxetic Foams by X-Ray Tomography and Digital Volume Correlation
  Published in: Advances in Experimental Mechanics VIII (p93)
• Characterization of Dislocations and Micropipes in 4H n⁺ SiC Substrates
  Published in: Silicon Carbide and Related Materials 2007 (p333)
• Characterization of Laser-Irradiated Cd_xHg_1-xTe Solid Solutions by Scanning Microscopy Method
  Published in: Beam Injection Assessment of Defects in Semiconductors (p353)
• Complex Behavior of Threading Dislocations Observed in PVT-Grown 4H-SiC Single Crystals
  Published in: Silicon Carbide and Related Materials 2011 (p355)
• Contrast of Basal Plane and Threading Edge Dislocations in 4H-SiC by X-Ray Topography in Grazing Incidence Geometry
  Published in: Silicon Carbide and Related Materials 2007 (p321)
• Correlation between SEM and X-Ray Diffraction Imaging of Defect Structure in Single-Crystal Ni-Based Superalloy
  Published in: Electron Microscopy XIV (p135)
• Correlation between Surface Morphological Defects and Crystallographic Defects in SiC
  Published in: Silicon Carbide and Related Materials 2011 (p359)