Papers by Keyword: X-ray Microbeam

Abstract: A synchrotron white x-ray microbeam diffraction method was employed to investigate lattice distortion in multicrystalline silicon for photovoltaic cells. The measurements were carried out by scanning the sample, and transmission Laue patterns were observed at each position on the sample. Intensity and position maps of the Laue spots showed the distribution of the crystalline quality of the grains and the bending of the lattice planes. Strain and bending distributions were extracted from an analysis of Laue spots at diagonal positions, and these were compared with those obtained by other techniques.

Abstract: After an overload was imposed during a constant amplitude fatigue experiment, a retardation period was observed. The deformation in the vicinity of a crack tip was studied using neutron and x-ray microbeam-diffraction techniques, which provide millimeter and submicrometer spatial resolutions, respectively. From the neutron-diffraction measurements, compressive lattice strains and higher dislocation densities at the macroscale were observed in front of the crack tip, which indicates a plasticity induced crack-closure phenomenon. Furthermore, Laue patterns obtained from the microbeam diffraction at different locations near the crack tip show alternating regions with high and low dislocation densities at the mesoscale.