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Articles by keyword: «Yield»

• Agroforestry Systems in Northern Temperate Zone and Productive Perspectives
  Published in: Multi-Functional Materials and Structures Engineering (p253)
• Binder-Free Pellet Fabrication of Ultra-Fine Poly-Si Powder for Economical Production of Solar Grade Si Ingot
  Published in: Eco-Materials Processing and Design X (p61)
• Comparison of Electrical Characteristics of 4H-SiC(0001) and (000-1) Schottky Barrier Diodes
  Published in: Silicon Carbide and Related Materials 2005 (p927)
• Cultivating Succeeding Crops in Transgenic Soybean Overexpressing TaDREB3 Planted Field Had No Impact on Crop Yield and Quality
  Published in: Frontiers of Manufacturing and Design Science II (p2597)
• Delamination of Cu and Ti Thin Films Deposited by Magnetron Sputtering on Cu Substrate: Analysis of Reasons
  Published in: THERMEC 2011 (p2863)
• Design and Yield of 9 kV Unipolar Normally-ON Vertical-Channel SiC JFETs
  Published in: Silicon Carbide and Related Materials 2010 (p617)
• Effect of Ammonium and Nitrate Ratios on Growth and Yield of Chinese Kale
  Published in: Intelligent Materials, Applied Mechanics and Design Science (p32)
• Effect of Biological Organic Fertilizer on Plant Growth and Yield of Chinese Kale
  Published in: Intelligent Materials, Applied Mechanics and Design Science (p175)
• Effect of Helium on Synthesis of Carbon Nanotubes from the V-Type Pyrolysis Flame
  Published in: Advanced Polymer Science and Engineering (p540)
• Effect of Sulfate- and Carbonyl- Polysaccharides on Quality Characteristics of Tofu
  Published in: Advances in Chemical Engineering (p1680)
• Effects of Biochar on Acid Black Soil Nutrient, Soybean Root and Yield
  Published in: Natural Resources and Sustainable Development II (p2278)
• Effects of Processing on the Yield and Physico-Chemical Properties of Cassava Products
  Published in: Advances in Materials and Systems Technologies (p165)
• Experimental Study on Anti-Shear Properties of Floor Heave Control Anchor of Deep Soft Rock
  Published in: Materials Science and Engineering Application II (p190)
• Improvement of SBD Electronic Characteristics Using Sacrificial Oxidation Removing the Degraded Layer from SiC Surface after High Temperature Annealing
  Published in: Silicon Carbide and Related Materials 2006 (p877)
• Mapping of Device Yield Relevant Electrical Si-Wafer Parameters
  Published in: Gettering and Defect Engineering in Semiconductor Technology XII (p511)